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Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and atomically-resolved image of an al cluster
Saito, Yahachi
Matsukawa, Tomohiro
Asaka, Koji
Nakahara, Hitoshi
open access
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In this work, aluminum (Al) was deposited on MWNT field emitters and its effects on FE properties were studied by FEM. A considerable improvement of emission stability was obtained by Al-deposition, and an atomically-resolved image of an Al cluster with face-centered structure was observed by FEM.
IEEE
2009-07-20
eng
journal article
VoR
http://hdl.handle.net/2237/13979
https://nagoya.repo.nii.ac.jp/records/12101
https://doi.org/10.1109/IVNC.2009.5271633
978-1-4244-3587-6
22nd International Vacuum Nanoelectronics Conference (IVNC 2009)
7
8
https://nagoya.repo.nii.ac.jp/record/12101/files/saito.pdf
application/pdf
161.1 kB
2018-02-20