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https://nagoya.repo.nii.ac.jp/oai
oai:nagoya.repo.nii.ac.jp:00018731
2023-01-16T04:07:32Z
320:321:322
Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis
Muto, S.
Fujimichi, Y.
Tatsumi, K.
Kawano, T.
Yamane, H.
open access
This is the author's version of a work that was accepted for publication in Optical Materials. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms, may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Optical Materials. v.33, n.7, 2011, p.1015–1018, DOI:10.1016/j.optmat.2010.09.022.
Rare-earth dopant
Transmission electron microscopy
Energy-dispersive X-ray analysis
Electron energy-loss spectroscopy
Electron channeling
Energy-dispersive X-ray analysis based on electron channeling effects in transmission electron microscopy (TEM) was performed on Ca2SnO4 phosphor materials doped with Eu3+/Y3+ at various concentrations, which showed red photoluminescence associated with the Eu3+5D0–7F2 electric dipole transition. The method provided direct information on which host element site impurity elements occupy. The local atomic configurations and chemical bonding states associated with dopant impurities with different ionic radii were also examined by TEM–electron energy-loss spectroscopy (TEM–EELS).
Elsevier
2011-05
eng
journal article
AM
http://hdl.handle.net/2237/20827
https://nagoya.repo.nii.ac.jp/records/18731
https://doi.org/10.1016/j.optmat.2010.09.022
0925-3467
Optical Materials
33
7
1015
1018
https://nagoya.repo.nii.ac.jp/record/18731/files/OptMat20111.pdf
application/pdf
404.8 kB
2018-02-21