2024-03-29T14:04:00Z
https://nagoya.repo.nii.ac.jp/oai
oai:nagoya.repo.nii.ac.jp:00003869
2023-01-16T03:48:17Z
320:321:322
A simple method of the electric/magnetic field observation by a conventional transmission electron microscope
Sasaki, Katsuhiro
9768
Saka, Hiroyasu
9769
In-situ observation
Geometrical optics
SAD aperture
lens
A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1V/μm. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.
Pacific Rim International Conference on Advanced Materials and Processing <DA14524950> (5th : 2004 : Beijing, China) Organizedand sponsored by the Chinese Society for Metals
journal article
Trans Tech Publications Inc.
2005
application/pdf
Materials Science Forum
475-479
4029
4034
http://hdl.handle.net/2237/5299
0255-5476
https://nagoya.repo.nii.ac.jp/record/3869/files/SCIENTIFICNET_8036588_52684189033808.pdf
eng
https://doi.org/10.4028/www.scientific.net/MSF.475-479.4029
0-87849-960-1