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Magnetic and junction properties of half-metallic double-perovskite thin films
Asano, H.
13044
Koduka, N.
13045
Imaeda, K.
13046
Sugiyama, M.
13047
Matsui, M.
13048
Double perovskite
epitaxial film
half-metallic feromagnet
magnetic tunnel junction
This paper reports the magnetic, electrical, and microstructural properties of epitaxial thin films with an ordered double-perovskite structure. Sr2 FeMoO6 (SFMO) and Sr2 CrReO6 (SCRO) films have been grown by sputtering onto the lattice-matched substrates of Ba0.4 Sr0.6 TiO3 -buffered and bare SrTiO3, respectively. These films exhibit high saturation magnetization Ms values (3.8μB/f.u. for SFMO and 0.9μB/f.u. for SCRO), which are close to the expected values for their half-metallicity, and high curie temperature Tc values (385 K for SFMO and 620 K for SCRO). Surface analyzes by AFM and XPS indicate that these films have atomically flat and well-defined surfaces, which are free from any surface precipitates. This enables us to employ a standard photolithographic process for fabricating magnetic tunnel junctions based on these films. SFMO junctions with a native barrier formed by surface oxidation of a SFMO base-electrode and a Co counterelectrode have shown a tunnel magnetoresistance ratio of 10% at 4.2 K.
journal article
IEEE
2005-10
application/pdf
IEEE Transactions on Magnetics
10
41
2811
2813
http://hdl.handle.net/2237/6775
0018-9464
https://nagoya.repo.nii.ac.jp/record/5191/files/01519130.pdf
eng
https://doi.org/10.1109/TMAG.2005.854836
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