2024-03-28T17:04:50Z
https://nagoya.repo.nii.ac.jp/oai
oai:nagoya.repo.nii.ac.jp:00005376
2023-01-16T05:03:25Z
673:674:675
Differential microscopy by conventional electron off-axis holography
Tanji, Takayoshi
13702
Ru, Qingxin
13703
Tonomura, Akira
13704
Differential microscopy is realized by conventional off-axis electron holography with an electron biprism behind the specimen. Two phase images reconstructed from two holograms which are obtained with slightly different potentials of the electron biprism are utilized to make a one-dimensional differential image. Polystyrene latex particles which are charged by electron irradiation are used to demonstrate that the differential image is independent of the distortion of a reference wave.
journal article
American Institute of Physics
1996-10-28
application/pdf
Applied Physics Letters
28
69
2623
2625
http://hdl.handle.net/2237/6981
0003-6951
https://nagoya.repo.nii.ac.jp/record/5376/files/ApplPhysLett_69_2623.pdf
eng
https://doi.org/10.1063/1.117555
Copyright (1996) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.