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Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and atomically-resolved image of an al cluster
Saito, Yahachi
38413
Matsukawa, Tomohiro
38414
Asaka, Koji
38415
Nakahara, Hitoshi
38416
In this work, aluminum (Al) was deposited on MWNT field emitters and its effects on FE properties were studied by FEM. A considerable improvement of emission stability was obtained by Al-deposition, and an atomically-resolved image of an Al cluster with face-centered structure was observed by FEM.
journal article
IEEE
2009-07-20
application/pdf
22nd International Vacuum Nanoelectronics Conference (IVNC 2009)
7
8
http://hdl.handle.net/2237/13979
http://dx.doi.org/10.1109/IVNC.2009.5271633
https://nagoya.repo.nii.ac.jp/record/12101/files/saito.pdf
eng
https://doi.org/10.1109/IVNC.2009.5271633
978-1-4244-3587-6
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