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A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM
Yamasaki, Jun
39202
Kawai, Tomoyuki
39203
Kondo, Yushi
39204
Tanaka, Nobuo
39205
Aberration-corrected TEM
nonlinear component
image subtraction
image deconvolution
artificial image contrast
Cs-corrected TEM
We propose a simple and practical solution to remove artificial contrast inhibiting direct interpretation of atomic arrangements in aberration-corrected TEM. The method is based on a combination of “image subtraction” for elimination of nonlinear components in images and newly improved “image deconvolution” for proper compensation of nonflat phase contrast transfer function. The efficiency of the method is shown by experimental and simulation data of typical materials such as gold, silicon, and magnesium oxide. The hypothetical results from further improvements of TEM instruments are also simulated. It is concluded that we can approach actual atomic structures by using the present method, that is, a proper combination of a Cs corrector, image subtraction, and image deconvolution processes.
journal article
Cambridge University Press
2008-02
application/pdf
Microscopy and Microanalysis
1
14
27
35
http://hdl.handle.net/2237/14314
http://dx.doi.org/10.1017/S1431927608080173
1431-9276
https://nagoya.repo.nii.ac.jp/record/12429/files/download3.pdf
eng
https://doi.org/10.1017/S1431927608080173
Cambridge University Press