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2023-01-16T04:07:32Z
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Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis
Muto, S.
54592
Fujimichi, Y.
54593
Tatsumi, K.
54594
Kawano, T.
54595
Yamane, H.
54596
Rare-earth dopant
Transmission electron microscopy
Energy-dispersive X-ray analysis
Electron energy-loss spectroscopy
Electron channeling
Energy-dispersive X-ray analysis based on electron channeling effects in transmission electron microscopy (TEM) was performed on Ca2SnO4 phosphor materials doped with Eu3+/Y3+ at various concentrations, which showed red photoluminescence associated with the Eu3+5D0–7F2 electric dipole transition. The method provided direct information on which host element site impurity elements occupy. The local atomic configurations and chemical bonding states associated with dopant impurities with different ionic radii were also examined by TEM–electron energy-loss spectroscopy (TEM–EELS).
journal article
Elsevier
2011-05
application/pdf
Optical Materials
7
33
1015
1018
http://dx.doi.org/10.1016/j.optmat.2010.09.022
http://hdl.handle.net/2237/20827
0925-3467
https://nagoya.repo.nii.ac.jp/record/18731/files/OptMat20111.pdf
eng
https://doi.org/10.1016/j.optmat.2010.09.022
This is the author's version of a work that was accepted for publication in Optical Materials. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms, may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Optical Materials. v.33, n.7, 2011, p.1015–1018, DOI:10.1016/j.optmat.2010.09.022.