{"_buckets": {"deposit": "fe8e9cf0-af0c-44e3-a5a6-4766fcf099e3"}, "_deposit": {"id": "10167", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "10167"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00010167"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2007", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "574", "bibliographicPageStart": "572", "bibliographicVolumeNumber": "882", "bibliographic_titles": [{"bibliographic_title": "AIP Conference Proceedings"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "X-ray excited optical luminescence (XEOL) of a fused silica glass was studied, varying excitation X-ray energy, irradiation time and temperature. At room temperature, an emission band peaked around 3.1 eV was observed, the origin of which has been assigned to the intrinsic B_2\u03b2 oxygen deficient center. The luminescence yield was drastically decreased for the X-ray energy corresponding to the ionization threshold of the Si K-edge, while its time evolutions followed exponential production-saturation curves, which were almost independent of the excitation X-ray energies. At 50 K, on the other hand, an additional emission band appeared at the lower energy side, resulting in the emission band broadening. The intensity of the additional band was decreased monotonically with the irradiation time only for the resonance excitation from 1s to 3p of Si atoms in SiO_2 (1848 eV). These results indicate that high-density excitations of inner-shell electrons can give rise to production and/or annihilation of specific types of point defects.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1063/1.2644597"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/11985"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "American Institite of Physics"}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright (2007) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0094-243X", "subitem_source_identifier_type": "ISSN"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Yoshida, Tomoko"}], "nameIdentifiers": [{"nameIdentifier": "30675", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Muto, Shunsuke"}], "nameIdentifiers": [{"nameIdentifier": "30676", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tanabe, Tetsuo"}], "nameIdentifiers": [{"nameIdentifier": "30677", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-20"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "24065353.pdf", "filesize": [{"value": "1.4 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1400000.0, "url": {"label": "24065353.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/10167/files/24065353.pdf"}, "version_id": "48251932-87a1-49cf-8d36-86deaf4f5674"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "XEOL", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Si K-edge", "subitem_subject_scheme": "Other"}, {"subitem_subject": "silica glass", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Measurement of Soft X-Ray Excited Optical Luminescence of a Silica Glass", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Measurement of Soft X-Ray Excited Optical Luminescence of a Silica Glass"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/11985", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2009-07-29"}, "publish_date": "2009-07-29", "publish_status": "0", "recid": "10167", "relation": {}, "relation_version_is_last": true, "title": ["Measurement of Soft X-Ray Excited Optical Luminescence of a Silica Glass"], "weko_shared_id": null}