{"created":"2021-03-01T06:16:59.174049+00:00","id":10174,"links":{},"metadata":{"_buckets":{"deposit":"66d9bb89-78e7-4a66-a4f1-bee3f114d138"},"_deposit":{"id":"10174","owners":[],"pid":{"revision_id":0,"type":"depid","value":"10174"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00010174","sets":["336:695:696"]},"author_link":["30731","30732","30733","30734","30735","30736","30737","30738","30739","30740","30741","30742","30743"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"1076","bibliographicPageStart":"1071","bibliographicVolumeNumber":"915","bibliographic_titles":[{"bibliographic_title":"AIP Conference Proceedings","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Extremely low emittance electron beams are necesarry for new generation accelerators.  The value of the required emittances is as low as 0.1 π.mm.mrad. NEA-type photocathodes have an  intrinsic advantage for generating such a low emittance beam. In this paper, emittance measuremets of photelectrons extracted from two different NEA phtocahtodes are described. The measurements were carried out using Nagoya University 200kV polarized electron source. The normalized RMS emittances of bulk-GaAs and GaAs-GaAsP superlattice strained photocathodes are as low as 0.12–0.17 ± 0.02 π.mm.mrad and 0.09 ± 0.01 π.mm.mrad with very low charge density, respectively.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1063/1.2750955"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/11992"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institite of Physics","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.2750955","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (2007) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0094-243X","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamamoto, Naoto","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30731","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamamoto, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30732","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sakai, R.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30733","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakanishi, T.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30734","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okumi, S.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30735","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kuwahara, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30736","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tamagaki, K.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30737","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Morino, T.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30738","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Utsu, A.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30739","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mano, A.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30740","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kuriki, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30741","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ujihara, T.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30742","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takeda, Y.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30743","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"25483994.pdf","filesize":[{"value":"482.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"25483994.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/10174/files/25483994.pdf"},"version_id":"1a061f8a-bb0b-4e73-86da-af6193d15945"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Thermal emittance","subitem_subject_scheme":"Other"},{"subitem_subject":"NEA surface","subitem_subject_scheme":"Other"},{"subitem_subject":"GaAs","subitem_subject_scheme":"Other"},{"subitem_subject":"Semiconductors","subitem_subject_scheme":"Other"},{"subitem_subject":"Photoinjector","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Initial Emittance Measurements for Polarized Electron Gun with NEA-GaAs Type Photocathode","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Initial Emittance Measurements for Polarized Electron Gun with NEA-GaAs Type Photocathode","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["696"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2009-07-30"},"publish_date":"2009-07-30","publish_status":"0","recid":"10174","relation_version_is_last":true,"title":["Initial Emittance Measurements for Polarized Electron Gun with NEA-GaAs Type Photocathode"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:37:47.260850+00:00"}