{"created":"2021-03-01T06:17:01.069875+00:00","id":10205,"links":{},"metadata":{"_buckets":{"deposit":"4762d19f-256d-4f7a-b4f0-7b23f0b19b81"},"_deposit":{"id":"10205","owners":[],"pid":{"revision_id":0,"type":"depid","value":"10205"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00010205","sets":["312:598:599"]},"author_link":["30890","30891"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-11","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"260","bibliographicPageStart":"257","bibliographic_titles":[{"bibliographic_title":"17th Asian Test Symposium IEEE","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Level-testability of multi-operand adders consisting of carry save adders is shown by showing test design for them.  A multi-operand adder is a main part of a multiplier.  6L + 2patterns are sufficient to test a multi-operand adder under cell fault model, where L denotes the depth of the multi-operand adder.  A test method of the multi-operand adder used as a partial product compressor in a multiplier is also shown.  This result gives an upper bound of the number of required test patterns for a multi-operand adder in any multiplier.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1109/ATS.2008.40"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/12025"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ATS.2008.40","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2008 IEEE. Reprinted from IEEE 17th Asian Test Symposium, 2008, p.257-260. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University's products or services. Internal or personal use of this material is permitted. <br/>However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kito, Nobutaka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30890","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takagi, Naofumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"30891","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"Takagi.pdf","filesize":[{"value":"539.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Takagi.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/10205/files/Takagi.pdf"},"version_id":"b37ef313-b981-4710-a775-aa49f6481223"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Level-Testability of Multi-operand Adders","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Level-Testability of Multi-operand Adders","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["599"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2009-08-04"},"publish_date":"2009-08-04","publish_status":"0","recid":"10205","relation_version_is_last":true,"title":["Level-Testability of Multi-operand Adders"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:56:07.063595+00:00"}