{"created":"2021-03-01T06:17:07.487805+00:00","id":10307,"links":{},"metadata":{"_buckets":{"deposit":"d73bdb67-5513-43d5-9a38-94932335358c"},"_deposit":{"id":"10307","owners":[],"pid":{"revision_id":0,"type":"depid","value":"10307"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00010307","sets":["320:502:503"]},"author_link":["31241","31242","31243","31244","31245"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"438","bibliographicPageStart":"435","bibliographic_titles":[{"bibliographic_title":"Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2008)","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"To achieve a safe operation of gas insulated switchgears (GISs), the reliability of electrical insulation is one of the fundamental importance. For this respect, there is an urgent need for better understanding of partial discharge (PD)  mechanisms at different locations in GIS. In the current work, the PD inception characteristics at electrode/epoxy interface at insulating spacer in GIS, which represents one of the most critical defects in GIS, are obtained and investigated with different gap lengths, 50~500 μm. Partial discharge inception voltage (PDIV) and electric field (PDIE) are measured and analyzed regarding PD inception mechanism in SF_6 gas. Also the dependence of PDIV on repetitive number of PD pulses is obtained and discussed from the viewpoint of accumulated charge on the epoxy surface.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1109/CEIDP.2008.4772884"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/12127"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/CEIDP.2008.4772884","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2008 IEEE. Reprinted from Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. p.435-438.<br/>This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Mansour, D.A.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31241","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kojima, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31242","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayakawa, N.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31243","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Endo, F.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31244","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31245","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"CEIDP2008-000210.pdf","filesize":[{"value":"723.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"CEIDP2008-000210.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/10307/files/CEIDP2008-000210.pdf"},"version_id":"25011faf-924e-4e7e-90e4-6509211a6a8b"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Partial Discharge Characteristics for Small Gap of Electrode/Epoxy Interface in SF6 Gas","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Partial Discharge Characteristics for Small Gap of Electrode/Epoxy Interface in SF6 Gas","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["503"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2009-08-31"},"publish_date":"2009-08-31","publish_status":"0","recid":"10307","relation_version_is_last":true,"title":["Partial Discharge Characteristics for Small Gap of Electrode/Epoxy Interface in SF6 Gas"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:56:19.811306+00:00"}