{"created":"2021-03-01T06:17:07.679752+00:00","id":10310,"links":{},"metadata":{"_buckets":{"deposit":"ec033a6e-10bf-421d-8d0d-7e6fd372f811"},"_deposit":{"id":"10310","owners":[],"pid":{"revision_id":0,"type":"depid","value":"10310"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00010310","sets":["320:502:503"]},"author_link":["31257","31258","31259","31260","31261","31262"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"378","bibliographicPageStart":"375","bibliographic_titles":[{"bibliographic_title":"Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2008)","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper discusses the partial discharge (PD) resistant mechanism of nanocomposite enamel wires under repetitive surge voltage condition for inverter-fed motors. We focused on the reduction of deterioration depth and the surface condition of nanocomposite enamel wires after repetitive surge voltage application with successive PD. Experimental results revealed that the longer lifetime of breakdown of nanocomposite enamel  wires compared with the conventional wires would be brought about not only by the filled nano materials, but also by their byproduct on the enamel surface under repetitive PD generation. The erosion of nanocomposite enamel layers was suppressed in depth by the byproduct and dispersed in the longitudinal direction along the enamel surface, which could contribute to the longer lifetime of breakdown than conventional wires.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1109/CEIDP.2008.4772764"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/12130"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/CEIDP.2008.4772764","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2008 IEEE. Reprinted from Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. p.375-378.<br/>This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"author"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Nakamura, Yusuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31257","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Inano, Hiroshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31258","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroshima, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31259","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hirose, Tatsuya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31260","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hamaguchi, Masahiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31261","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, Hitoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31262","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"CEIDP-1.pdf","filesize":[{"value":"884.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"CEIDP-1.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/10310/files/CEIDP-1.pdf"},"version_id":"6090a5e8-6e16-4686-857f-c53826d9b810"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["503"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2009-08-31"},"publish_date":"2009-08-31","publish_status":"0","recid":"10310","relation_version_is_last":true,"title":["Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:56:20.223251+00:00"}