{"created":"2021-03-01T06:17:56.706818+00:00","id":11074,"links":{},"metadata":{"_buckets":{"deposit":"9e18f2af-192d-44e1-8af6-626739045bb0"},"_deposit":{"id":"11074","owners":[],"pid":{"revision_id":0,"type":"depid","value":"11074"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00011074","sets":["320:1092:1093"]},"author_link":["33563","33564","33565","33566","33567","33568"],"item_1618209983323":{"attribute_name":"助成情報","attribute_value_mlt":[{"subitem_award_numbers":{"subitem_award_number":"62420021","subitem_award_uri":"https://kaken.nii.ac.jp/ja/grant/KAKENHI-PROJECT-62420021"},"subitem_award_titles":[{"subitem_award_title":"試料損傷のない高解像度電子顕微鏡観察法の研究","subitem_award_title_language":"ja"}],"subitem_funder_identifiers":{"subitem_funder_identifier":"https://doi.org/10.13039/501100001691","subitem_funder_identifier_type":"Crossref Funder"},"subitem_funder_names":[{"subitem_funder_name":"日本学術振興会","subitem_funder_name_language":"ja"}]}]},"item_19_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1990-03","bibliographicIssueDateType":"Issued"}}]},"item_19_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"1.超高圧電界放出電子銃真空系の改造と電子銃の動作をモニタ-するとともに適切な条件で動作させるモニタ-・コントロ-ルシステムを開発し、1000kV超高圧走査透過電顕に電界放出電子銃の搭載を行った。<310>方位W単結晶陰極を使用して、50μA以上の放出電流を安定に得ることができた。 2.各種信号電子の検出信号電子の高感度検出のためには、シンチレ-タとしてYAG単結晶を使用する新たな方法を採用し、従来の粉末蛍光体と比べて10倍の高感度を得た。また、エネルギ-分析器の改良を行い、非弾性散乱および非散乱電子の高精度検出の方法を確立した。 3.信号演算処理弾性散乱、非弾性散乱および非散乱電子間の各種演算像についての理論的検討を行い、観察対象に応じた適切な演算法を明らかにした。また、電子信号を効率よく取り込むインタ-フェイスと種々の演算処理を行うソフトウェアを開発し、信号演算システムを確立した。さらに、実際の像観察に適用し、ノイズ除去、特定元素による構造のコントラスト強調、試料構成元素の識別などについて成果を得た。 4.照射電流密度の試料損傷への影響と試料損傷のない高解像度観察ヘキサトリアコンタン結晶試料について電子回析パタ-ンの強度の変化を調べた結果、電流密度の高い微少電子プロ-ブで照射する走査透過電顕モ-ドでは、低電流密度で長時間照射する通常型電顕モ-ドに比べて、試料損傷を低減できることが明らかとなった。また、通常型電顕モ-ドの観察によれば粒子の移動、統合、結晶化が起るカ-ボン膜中の白金微粒子が、走査透過電顕モ-ドの観察では試料変化が生じず、損傷のない高解像度観察ができることを実証した。","subitem_description_language":"ja","subitem_description_type":"Abstract"}]},"item_19_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"科学研究費補助金 研究種目:一般研究(A) 課題番号:62420021 研究代表者:日比野 倫夫 研究期間:1987-1989年度","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_19_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/12936"}]},"item_19_relation_40":{"attribute_name":"シリーズ","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"科学研究費補助金;一般研究(A);62420021"}]}]},"item_19_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_19_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"日比野, 倫夫","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33563","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"丸勢, 進","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33564","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"下山, 宏","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33565","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"杉山, せつ子","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33566","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"花井, 孝明","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33567","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"内川, 嘉樹","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33568","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"62420021.pdf","filesize":[{"value":"2.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"62420021.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/11074/files/62420021.pdf"},"version_id":"92370934-36cd-4978-8c46-37f8000e5629"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"試料損傷","subitem_subject_scheme":"Other"},{"subitem_subject":"高解像度電子顕微鏡観察","subitem_subject_scheme":"Other"},{"subitem_subject":"像のSN比","subitem_subject_scheme":"Other"},{"subitem_subject":"画像処理","subitem_subject_scheme":"Other"},{"subitem_subject":"走査透過電子顕微鏡","subitem_subject_scheme":"Other"},{"subitem_subject":"電界放出電子銃","subitem_subject_scheme":"Other"},{"subitem_subject":"超高圧走査透過電子顕微鏡","subitem_subject_scheme":"Other"},{"subitem_subject":"Image processing","subitem_subject_scheme":"Other"},{"subitem_subject":"信号電子検出法","subitem_subject_scheme":"Other"},{"subitem_subject":"Signal electron detection","subitem_subject_scheme":"Other"},{"subitem_subject":"信号電子演算","subitem_subject_scheme":"Other"},{"subitem_subject":"High resolution observation","subitem_subject_scheme":"Other"},{"subitem_subject":"高解像度観察","subitem_subject_scheme":"Other"},{"subitem_subject":"信号間演算処理","subitem_subject_scheme":"Other"},{"subitem_subject":"High voltage STEM","subitem_subject_scheme":"Other"},{"subitem_subject":"Specimen damage","subitem_subject_scheme":"Other"},{"subitem_subject":"eld emission electron gun","subitem_subject_scheme":"Other"},{"subitem_subject":"YAG単結晶シンチレ-タ","subitem_subject_scheme":"Other"},{"subitem_subject":"ノイズ除去","subitem_subject_scheme":"Other"},{"subitem_subject":"Manipulation among signal electrons","subitem_subject_scheme":"Other"},{"subitem_subject":"信号電子間演算","subitem_subject_scheme":"Other"},{"subitem_subject":"信号演算処理","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"試料損傷のない高解像度電子顕微鏡観察法の研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"試料損傷のない高解像度電子顕微鏡観察法の研究","subitem_title_language":"ja"}]},"item_type_id":"19","owner":"1","path":["1093"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2010-03-12"},"publish_date":"2010-03-12","publish_status":"0","recid":"11074","relation_version_is_last":true,"title":["試料損傷のない高解像度電子顕微鏡観察法の研究"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T05:10:20.214306+00:00"}