{"created":"2021-03-01T06:17:57.837826+00:00","id":11092,"links":{},"metadata":{"_buckets":{"deposit":"d95d4c1e-a5d0-48fc-af02-3571db709bff"},"_deposit":{"id":"11092","owners":[],"pid":{"revision_id":0,"type":"depid","value":"11092"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00011092","sets":["320:1092:1093"]},"author_link":["33590","33591","33592","33593"],"item_1618209983323":{"attribute_name":"助成情報","attribute_value_mlt":[{"subitem_award_numbers":{"subitem_award_number":"63850078","subitem_award_uri":"https://kaken.nii.ac.jp/ja/grant/KAKENHI-PROJECT-63850078"},"subitem_award_titles":[{"subitem_award_title":"走査透過電子顕微鏡における弾性・非弾性散乱信号のオンライン・ディジタル演算処理","subitem_award_title_language":"ja"}],"subitem_funder_identifiers":{"subitem_funder_identifier":"https://doi.org/10.13039/501100001691","subitem_funder_identifier_type":"Crossref Funder"},"subitem_funder_names":[{"subitem_funder_name":"日本学術振興会","subitem_funder_name_language":"ja"}]}]},"item_19_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1990-03","bibliographicIssueDateType":"Issued"}}]},"item_19_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"1.電子検出法の改善 STEM(走査透過電子顕微鏡)における電子検出器として従来使われているP46粉末蛍光体について、100kVの加速圧電圧において最高感度を与える厚さを調べた結果、0.07mm厚さの蛍光体が最適であり、高いDQEが得られることを示した。また、1mm厚さのYAG単結晶を使用すれば、約4倍の感度が得られ、感度の均一性もすぐれていることを明らかにした。非弾性散乱および非散乱電子の検出については、信号電子偏向用マグネットおよび絞り板の設置により、X線および漂遊電子線を除いた高精度検出ができることを示した。 2.像信号のディジタル処理システム 3種類までの電子信号をディジタル的に高精度で取り込み、処理のできるシステムを開発した。サンプリングによる高周波の折り返しの誤差に特に注意を払い、バタ-ワ-ス型アンチェイリアシングフィルタの使用によって、ディジタル化の誤差を0.2%以下に抑えることができた。 3.ディジタル演算処理ロ-パスフィルタと併用したデコンボリュ-ションにより、擬似像の影響のない解像度向上のための、ロ-パスフィルタ-の窓の形状を明らかにし、適切な条件のもとでは約40%の解像度の改善ができることを明らかにした。また、入射電子による信号電子の規格化による像SN比の改善の定量的評価を行った結果、理論から期待されるSN比の改善ができることが明らかとなった。さらに、弾性散乱および非弾性散乱電子を用いた演算処理を行い、比の演算像においては局所厚さに依存しない原子番号に比例したコントラストの像が得られ、減算像においては特定原子番号の元素の構造のコントラストを消去、あるいは強調できることを実証した。","subitem_description_language":"ja","subitem_description_type":"Abstract"}]},"item_19_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"科学研究費補助金 研究種目:試験研究 課題番号:63850078 研究代表者:日比野 倫夫 研究期間:1988-1989年度","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_19_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/12957"}]},"item_19_relation_40":{"attribute_name":"シリーズ","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"科学研究費補助金;試験研究;63850078"}]}]},"item_19_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_19_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"日比野, 倫夫","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33590","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"下山, 宏","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33591","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"杉山, せつ子","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33592","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"花井, 孝明","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"33593","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"63850078.pdf","filesize":[{"value":"2.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"63850078.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/11092/files/63850078.pdf"},"version_id":"d99db5bd-5b9a-4759-9ab5-107d3501c045"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"走査透過電子顕微鏡","subitem_subject_scheme":"Other"},{"subitem_subject":"非弾性散乱電子","subitem_subject_scheme":"Other"},{"subitem_subject":"特殊コントラスト","subitem_subject_scheme":"Other"},{"subitem_subject":"電子信号間演算","subitem_subject_scheme":"Other"},{"subitem_subject":"弾性散乱電子","subitem_subject_scheme":"Other"},{"subitem_subject":"ノイズ除去","subitem_subject_scheme":"Other"},{"subitem_subject":"ディジタル処理システム","subitem_subject_scheme":"Other"},{"subitem_subject":"Specific contrast","subitem_subject_scheme":"Other"},{"subitem_subject":"Digital processing system","subitem_subject_scheme":"Other"},{"subitem_subject":"Noise elimination","subitem_subject_scheme":"Other"},{"subitem_subject":"Inelastically scattered electron","subitem_subject_scheme":"Other"},{"subitem_subject":"SN比","subitem_subject_scheme":"Other"},{"subitem_subject":"非弾性散乱","subitem_subject_scheme":"Other"},{"subitem_subject":"量子検出効率","subitem_subject_scheme":"Other"},{"subitem_subject":"Electron signal manipulation","subitem_subject_scheme":"Other"},{"subitem_subject":"デコンボリュ-ション処理","subitem_subject_scheme":"Other"},{"subitem_subject":"弾性散乱","subitem_subject_scheme":"Other"},{"subitem_subject":"Elastically scattered electron","subitem_subject_scheme":"Other"},{"subitem_subject":"Scanning transmission electron microscopy","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research 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