{"created":"2021-03-01T06:18:23.753258+00:00","id":11500,"links":{},"metadata":{"_buckets":{"deposit":"94737786-a3f1-447e-b858-b411ebaa9ce4"},"_deposit":{"id":"11500","owners":[],"pid":{"revision_id":0,"type":"depid","value":"11500"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00011500","sets":["879:1183:1184:1228"]},"author_link":["80479","80480","80481","80482"],"control_number":"11500","item_1615768549627":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_9_alternative_title_19":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Present Status of the GIC-and HVEE-Tandetron AMS Systems of the DMRC, Nagoya University","subitem_alternative_title_language":"en"}]},"item_9_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"45","bibliographicPageStart":"27","bibliographicVolumeNumber":"9","bibliographic_titles":[{"bibliographic_title":"名古屋大学加速器質量分析計業績報告書","bibliographic_titleLang":"ja"}]}]},"item_9_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In the financial years of 1995-1996,we introduced a second-generation Tandetron (a carbon dating system, Model 4130-AMS) which was manufactured by High Voltage Engineering Europe (HVEE) BV, the Netherlands. Main improvements of the 2nd-generation Tandetron compared with the old GIC(General Ionex Corporation)-Tandetron are : (1) a high intensity cesium sputter ion source is equipped with the new system, so that the ^<14>C counting rate is almost one order higher than that for the old system. In addition, since up to 59 targets can be loaded at a time, measurements can be conducted more efficiently. (2) carbon isotopes ^<12>C-, ^<13>C- and ^<14>C- are injected into a tandem accelerator simultaneously, by using a recombinator system, which will archive high accuracy measurements of the carbon isotope ratio. (3) the terminal voltage of the accelerator is 2.5MV, which gives the maximum yield in producing C^<3+> from C- in the charge exchange process of the tandem accelerator. In addition, a slit feedback system with a position sensitive Faraday cup to monitor the energy of accelerated ^<13>C^<3+> ions stabilizes terminal voltage, which provides us highly stable isotope-ratio measurement. (4) a gas ionization detector measures E and E_<residual> of incoming ions, to separate ^<14>C^<3+> ions from various background ions. Provided that the background ions are rejected efficiently, ^<14>C ages older than 60,000 will be measurable with this system. (5) A computer program is equipped with the system which controls the carbon-isotope-ratio measurement for multi-samples automatically. This provides us a high-efficient measurement without any hard works of operation staff. These improvements are discussed here in detail. As the results of those improvements stated above, the highest performances in the ^<14>C measurements with the new Tandetron is : (1) a measurement error of ^<14>C age can be as small as ±20 years with a measurement time of a few tens of minutes for a carbon sample of less than 1 mg ; (2) a full automatic measurement can be routinely performed ; (3) more than 3,000 samples can be measured annually.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_9_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"第10回名古屋大学タンデトロン加速器質量分析計シンポジウム(平成9 (1997)年度)報告 ｢最新型タンデトロン加速器質量分析計(加速器年代測定システム)による高精度･高分解能14C年代測定の利用分野･方法の開拓(II)｣","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.18999/10.19999/sumrua.9.27","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋大学年代測定資料研究センター 天然放射性元素測定小委員会","subitem_publisher_language":"ja"}]},"item_9_relation_43":{"attribute_name":"関連情報","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ci.nii.ac.jp/naid/110001136041/","subitem_relation_type_select":"URI"}}]},"item_9_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"名古屋大学年代測定資料研究センター 天然放射性元素測定小委員会","subitem_rights_language":"ja"},{"subitem_rights":"本文データは学協会の許諾に基づきCiNiiから複製したものである","subitem_rights_language":"ja"}]},"item_9_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_9_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"中村, 俊夫","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"80479","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakamura, Toshio","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"80480","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"パルス, ルディ","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"80481","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Pals, Ludi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"80482","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"KJ00002410045.pdf","filesize":[{"value":"993.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00002410045.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/11500/files/KJ00002410045.pdf"},"version_id":"d4ae0aff-fe98-45e4-9992-79cc75dbf4d1"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"加速器質量分析","subitem_subject_scheme":"Other"},{"subitem_subject":"タンデトロン","subitem_subject_scheme":"Other"},{"subitem_subject":"高輝度セシウムスパッタ負イオン源","subitem_subject_scheme":"Other"},{"subitem_subject":"同位体同時入射システム","subitem_subject_scheme":"Other"},{"subitem_subject":"リコンビネーター","subitem_subject_scheme":"Other"},{"subitem_subject":"ビームプロフィルモニタ","subitem_subject_scheme":"Other"},{"subitem_subject":"電離箱検出器","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"名古屋大学に設置されているGIC社およびHVEE社製の2台のタンデトロン加速器質量分析計の現状","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"名古屋大学に設置されているGIC社およびHVEE社製の2台のタンデトロン加速器質量分析計の現状","subitem_title_language":"ja"}]},"item_type_id":"9","owner":"1","path":["1228"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2010-05-19"},"publish_date":"2010-05-19","publish_status":"0","recid":"11500","relation_version_is_last":true,"title":["名古屋大学に設置されているGIC社およびHVEE社製の2台のタンデトロン加速器質量分析計の現状"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-11-17T02:55:27.367635+00:00"}