{"created":"2021-03-01T06:18:39.439659+00:00","id":11745,"links":{},"metadata":{"_buckets":{"deposit":"96d761d9-cadc-4632-8a9f-6e6bfe77a039"},"_deposit":{"created_by":17,"id":"11745","owners":[17],"pid":{"revision_id":0,"type":"depid","value":"11745"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00011745","sets":["879:1183:1184:1245"]},"author_link":["81809","81810","81811","81812","81813","81814","81815","81816","81817","81818","81819","81820","81821","81822"],"item_1615768549627":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_9_alternative_title_19":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Status and Applications of Tandetron II at Nagoya University(Proceedingsof the 17^<th> Symposium on Researches Using the Tandetron AMS System at Nagoya University in 2004)","subitem_alternative_title_language":"en"}]},"item_9_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"12","bibliographicPageStart":"7","bibliographicVolumeNumber":"16","bibliographic_titles":[{"bibliographic_title":"名古屋大学加速器質量分析計業績報告書","bibliographic_titleLang":"ja"}]}]},"item_9_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In 1981/82, a Tandetron AMS system manufactured by the General Ionex Corporation (GIC), USA, was installed at Nagoya University, and in autumn 1983, ^<14>C measurements began. Since then the GIC ^<14>C-AMS system has been used to measure samples for various research applications. A second ^<14>C-AMS system (Model 4130-AMS), built by High Voltage Engineering Europe (HVEE), B.V., The Netherlands, was delivered to Nagoya University in 1996/97. Acceptance tests were completed in January of 1999, and routine measurements began in mid-2000. Since completion of the acceptance tests in early 1999, we have encountered a lot of trouble with the machine, in particular in 2002. We have replaced a RF-transformer for high voltage generation system, a GVM motor to measure high voltage applied to the terminal of the tandem accelerator, etc, in 2002. After these troubles, the machine is relatively working well, expect for minor problems. However, it should be stressed that even a minor malfunction, ^<14>C measurements are not possible with the system. The numbers of targets measured were 330, 1430, 2077, 1003 and 1979 in the years 1999, 2000, 2001, 2002, 2003 respectively. In 2004, we have measured totally 1679 targets during the machine operations of 39 weeks. We have replaced a chiller unit of the water-cooling system, a plunger unit of target manipulator system in the ion source, a motor to drive the target wheel. These parts are moving steadily while the machine is in operation. Thus, we must maintain and replace them regularly for a routine and smooth operation of the Tandetron AMS system.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_9_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"第17回名古屋大学タンデトロン加速器質量分析計シンポジウム平成16(2004)年度報告 Proceedings of the 17th symposiumon Researches Using the Tandetron AMS System at Nagoya University in 2004\\\n日時:平成17 (2005)年1月24日(月)､25日(火) 会場:名古屋大学シンポジオン Date:January 24th and 25th, 2005 Place:Nagoya University Symposion Hall","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.18999/sumrua.16.7","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋大学年代測定資料研究センター","subitem_publisher_language":"ja"}]},"item_9_relation_43":{"attribute_name":"関連情報","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ci.nii.ac.jp/naid/110007150937/","subitem_relation_type_select":"URI"}}]},"item_9_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"名古屋大学年代測定資料研究センター","subitem_rights_language":"ja"},{"subitem_rights":"本文データは学協会の許諾に基づきCiNiiから複製したものである","subitem_rights_language":"ja"}]},"item_9_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_9_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open 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