@article{oai:nagoya.repo.nii.ac.jp:00012066,
 author = {Mansour, Diaa-Eldin A. and Kojima, Hiroki and Hayakawa, Naoki and Endo, Fumihiro and Okubo, Hitoshi},
 issue = {4},
 journal = {IEEE Transactions on Dielectrics and Electrical Insulation},
 month = {Aug},
 note = {The electrical insulation reliability of solid spacers in gas insulated switchgears (GISs) is an important issue to achieve a safe operation of such equipment. Among different phenomena, charge accumulation represents the most important matter that can degrade the overall performance of these insulation systems. For this respect, this paper discusses the contribution of partial discharge (PD) activity by ac voltage application to charge accumulation in the small gap at the electrode/epoxy interface as one of the weakest points in GIS solid spacers. The partial discharge inception voltages for non-accumulated charge case (PDIV0) and after exposing to PD activity (PDIVn) are measured among different gap lengths, simulating delamination at the electrode/epoxy interface. The PD activity is generated using applied voltage with 1.2à PDIV0 for all gap lengths examined in this study (50~500 ¿m). In these measurements, PDIV increased with increasing the number of PD pulses as a result of accumulated charges. The accumulated surface charge density is estimated using the boundary equations and is compared for the different gap lengths. The accumulated charge density was larger for the smaller gap lengths. Comparing PD parameters with accumulated charge density enabled us to identify that the number of negative and positive PD pulses is the main parameter that corresponds to charge accumulation process.},
 pages = {1150--1157},
 title = {Surface charge accumulation and partial discharge activity for small gaps of electrode/epoxy interface in sf6 gas},
 volume = {16},
 year = {2009}
}