{"created":"2021-03-01T06:19:02.233246+00:00","id":12101,"links":{},"metadata":{"_buckets":{"deposit":"ddb4db5a-74d8-4159-8879-1330dc389f6f"},"_deposit":{"id":"12101","owners":[],"pid":{"revision_id":0,"type":"depid","value":"12101"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00012101","sets":["320:321:322"]},"author_link":["38413","38414","38415","38416"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-07-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"8","bibliographicPageStart":"7","bibliographic_titles":[{"bibliographic_title":"22nd International Vacuum Nanoelectronics Conference (IVNC 2009)","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this work, aluminum (Al) was deposited on MWNT field emitters and its effects on FE properties were studied by FEM. A considerable improvement of emission stability was obtained by Al-deposition, and an atomically-resolved image of an Al cluster with face-centered structure was observed by FEM.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/13979"},{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1109/IVNC.2009.5271633"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/IVNC.2009.5271633","subitem_relation_type_select":"DOI"}}]},"item_10_relation_8":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type":"isPartOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-4244-3587-6","subitem_relation_type_select":"ISBN"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Saito, Yahachi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"38413","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsukawa, Tomohiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"38414","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Asaka, Koji","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"38415","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakahara, Hitoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"38416","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"saito.pdf","filesize":[{"value":"161.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"saito.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/12101/files/saito.pdf"},"version_id":"01e51bf4-92a2-49fa-bc42-5d40cf9d0d27"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and atomically-resolved image of an al cluster","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and atomically-resolved image of an al cluster","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2010-08-05"},"publish_date":"2010-08-05","publish_status":"0","recid":"12101","relation_version_is_last":true,"title":["Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and atomically-resolved image of an al cluster"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:58:47.495734+00:00"}