@article{oai:nagoya.repo.nii.ac.jp:00012284,
 author = {Saito, Yahachi and Matsukawa, Tomohiro and Asaka, Koji and Nakahara, Hitoshi},
 issue = {2},
 journal = {Journal of Vacuum Science & Technology B},
 month = {Mar},
 note = {Aluminum (Al) was deposited on multiwall carbon nanotubes (MWNTs) with mean thicknesses ranging from 1 to 11 nm in vacuum, and the influence of deposited Al on field electron emission was investigated by field emission microscopy (FEM). Al deposition significantly suppressed the fluctuations of emission current after a simple conditioning process. Interestingly, FEM images revealing the atomic detail of an Al cluster with the cubo-octahedron structure were observed. The discussion on the spatial resolution in FEM for MWNTs suggests the probable observation of some atomic structures with a resolution of the order of 0.3 nm.},
 pages = {C2A5--C2A8},
 title = {Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and image of an Al atom cluster},
 volume = {28},
 year = {2010}
}