{"created":"2021-03-01T06:19:34.461311+00:00","id":12605,"links":{},"metadata":{"_buckets":{"deposit":"17bdc734-0ac4-49fa-93c4-7f8c4a774790"},"_deposit":{"id":"12605","owners":[],"pid":{"revision_id":0,"type":"depid","value":"12605"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00012605","sets":["320:321:322"]},"author_link":["39659","39660","39661","39662"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"26","bibliographicPageStart":"22","bibliographic_titles":[{"bibliographic_title":"Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP)","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In order to realize the evaluation of electrical properties of materials in nanoscale orders, a method for the measurement of local conductivity was presented. A microwave atomic force microscope (M-AFM) probe in which microwave signals can propagate was fabricated. An open structure of a waveguide at the tip of the probe was introduced by focused ion beam (FIB) fabrication. The microwave measurement system consisted of the combination of a network analyzer working at 44.5 GHz and an AFM were used to measure the samples without contact. The amplitude and phase of the reflection coefficient of the microwave signal were measured to determine the electrical conductivity of non magnetic metals. The conductivity obtained by this method agrees with that measured by the high-frequency conductometry.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/14489"},{"subitem_identifier_type":"URI","subitem_identifier_uri":"http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5486451&isnumber=5486443"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_43":{"attribute_name":"関連情報","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5486451&isnumber=5486443","subitem_relation_type_select":"URI"}}]},"item_10_relation_8":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type":"isPartOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-4244-6636-8","subitem_relation_type_select":"ISBN"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"author"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Fujimoto, Akifumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"39659","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Zhang, Lan","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"39660","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hosoi, Atsushi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"39661","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ju, Yang","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"39662","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-20"}],"displaytype":"detail","filename":"1056.pdf","filesize":[{"value":"573.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"1056.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/12605/files/1056.pdf"},"version_id":"2d7b9a6c-9d2a-4f4e-8eb4-3252e1eb9531"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Structure Modification of M-AFM Probe for the Measurement of Local Conductivity","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Structure Modification of M-AFM Probe for the Measurement of Local Conductivity","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2011-02-25"},"publish_date":"2011-02-25","publish_status":"0","recid":"12605","relation_version_is_last":true,"title":["Structure Modification of M-AFM Probe for the Measurement of Local Conductivity"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:59:24.005589+00:00"}