{"created":"2021-03-01T06:21:43.095475+00:00","id":14595,"links":{},"metadata":{"_buckets":{"deposit":"5dffb06a-4028-447c-9b77-6c88739f3b49"},"_deposit":{"id":"14595","owners":[],"pid":{"revision_id":0,"type":"depid","value":"14595"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00014595","sets":["879:1183:1184:1395"]},"author_link":["83152","83153","83154","83155","83156","83157","83158","83159","83160","83161","83162","83163","83164","83165","83166","83167","83168","83169","83170","83171","83172","83173","83174","83175","83176","83177","83178","83179","83180","83181","83182","83183","83184","83185"],"item_1615768549627":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_9_alternative_title_19":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Status and Applications of a Tandetron AMS System at Nagoya University in 2010","subitem_alternative_title_language":"en"}]},"item_9_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"43","bibliographicPageStart":"37","bibliographicVolumeNumber":"22","bibliographic_titles":[{"bibliographic_title":"名古屋大学加速器質量分析計業績報告書","bibliographic_titleLang":"ja"}]}]},"item_9_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"An AMS system (Model 4130-AMS) dedicated to 14C measurements, built by High Voltage Engineering Europe (HVEE), B.V., The Netherlands, was delivered to Nagoya University in 1996/97. Acceptance tests of its performance on carbon isotope measurements were completed in January of 1999, and routine measurements began in mid-2000. Since completion of the acceptance tests in early 1999, we have encountered a lot of troubles with the machine, particularly in 2002. Since the end of 2002, the machine has worked relatively well, expect for minor problems. The standard deviation (one sigma) of the 14C/12C ratio is around ±0.3% to ±0 .4% (a bit larger than the uncertainty of about ±0.3% calculated from 14C counting statistics) and that of the corresponding 13C/12C ratio is ±0.03% to ±0.07%, as are tested for HOxII targets. The number of targets measured was 330, 1430, 2077, 1003, 1,979, 1679, 1771, 1115, 1339, 866, 1300, 1701 in each year from 1999 to 2010, respectively, and total number of target measured by the end of 2010 is 16,591. The Tandetron AMS system worked well in 2010, without serious troubles. From February 24th to March 17th, 2010, the AMS operating system was replaced from the one based on Windows 3.11 to the modified one based on Windows XP. The new operating system has several improvements that benefit the 14C measurement operation easier than the old system. In addition, we have been trouble a lot by high voltage sparks of the accelerator since 2006. To overcome this we have installed a water absorption system to remove water vapor from high voltage insulation gas, SF6, since 2008, immediately after the reinforcement work of the Furukawa Memorial Hall. We have operated the SF6 drying system as long as possible to keep the accelerator in good condition. Owing to this work, we have experienced only one high voltage spark on February 22nd, in full 2010. The total number of graphite targets measured was 1701 in 2010.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_9_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"第23回名古屋大学年代測定総合研究センターシンポジウム平成22(2010)年度報告","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.18999/sumrua.22.37","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋大学年代測定資料研究センター","subitem_publisher_language":"ja"}]},"item_9_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open 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