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  1. B200 工学部/工学研究科
  2. B200a 雑誌掲載論文
  3. 学術雑誌

Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals

http://hdl.handle.net/2237/20779
http://hdl.handle.net/2237/20779
c3c98d60-34ba-4405-8fd7-067cfb6be70b
名前 / ファイル ライセンス アクション
JEM2008.pdf JEM2008.pdf (1.2 MB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2014-11-17
タイトル
タイトル Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals
言語 en
著者 Sasano, Yusuke

× Sasano, Yusuke

WEKO 54418

en Sasano, Yusuke

Search repository
Muto, Shunsuke

× Muto, Shunsuke

WEKO 54419

en Muto, Shunsuke

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 This is a pre-copyedited, author-produced PDF of an article accepted for publication in [Journal of electron microscopy] following peer review. The version of record [Journal of electron microscopy. v.57, n.5, 2008, p.149-158] is available online at: [http://dx.doi.org/10.1093/jmicro/dfn014].
キーワード
主題Scheme Other
主題 EELS
キーワード
主題Scheme Other
主題 energy drift
キーワード
主題Scheme Other
主題 DM script
キーワード
主題Scheme Other
主題 trace elements
抄録
内容記述 The demand for analysis of trace elements in atomically localized areas by electron energy-loss spectroscopy (EELS) in transmission electron microscopy is increasing. Unfortunately, the prolonged data acquisitions required to achieve an acceptable signal-to-noise ratio (SNR) tend to deteriorate the energy resolution because of spectral drifts due to instrumental instability. We developed a macroscript for a Gatan Digital MicrographTM to control an ENFINA 1000 EEL spectrometer that corrects for energy drifts during data accumulation. The script successfully achieved a core-loss spectrum for a sample having ∼1 at% elemental concentration, and provided a sufficient SNR for chemical state analysis.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 Oxford University Press
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1093/jmicro/dfn014
ISSN
収録物識別子タイプ PISSN
収録物識別子 0022-0744
書誌情報 en : Journal of electron microscopy

巻 57, 号 5, p. 149-158, 発行日 2008-10
著者版フラグ
値 author
URI
識別子 http://dx.doi.org/10.1093/jmicro/dfn014
識別子タイプ DOI
URI
識別子 http://hdl.handle.net/2237/20779
識別子タイプ HDL
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