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Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals
http://hdl.handle.net/2237/20779
http://hdl.handle.net/2237/20779c3c98d60-34ba-4405-8fd7-067cfb6be70b
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2014-11-17 | |||||
タイトル | ||||||
タイトル | Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals | |||||
言語 | en | |||||
著者 |
Sasano, Yusuke
× Sasano, Yusuke× Muto, Shunsuke |
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アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
権利 | ||||||
言語 | en | |||||
権利情報 | This is a pre-copyedited, author-produced PDF of an article accepted for publication in [Journal of electron microscopy] following peer review. The version of record [Journal of electron microscopy. v.57, n.5, 2008, p.149-158] is available online at: [http://dx.doi.org/10.1093/jmicro/dfn014]. | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | EELS | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | energy drift | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | DM script | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | trace elements | |||||
抄録 | ||||||
内容記述 | The demand for analysis of trace elements in atomically localized areas by electron energy-loss spectroscopy (EELS) in transmission electron microscopy is increasing. Unfortunately, the prolonged data acquisitions required to achieve an acceptable signal-to-noise ratio (SNR) tend to deteriorate the energy resolution because of spectral drifts due to instrumental instability. We developed a macroscript for a Gatan Digital MicrographTM to control an ENFINA 1000 EEL spectrometer that corrects for energy drifts during data accumulation. The script successfully achieved a core-loss spectrum for a sample having ∼1 at% elemental concentration, and provided a sufficient SNR for chemical state analysis. | |||||
言語 | en | |||||
内容記述タイプ | Abstract | |||||
出版者 | ||||||
言語 | en | |||||
出版者 | Oxford University Press | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプresource | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
出版タイプ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1093/jmicro/dfn014 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 0022-0744 | |||||
書誌情報 |
en : Journal of electron microscopy 巻 57, 号 5, p. 149-158, 発行日 2008-10 |
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著者版フラグ | ||||||
値 | author | |||||
URI | ||||||
識別子 | http://dx.doi.org/10.1093/jmicro/dfn014 | |||||
識別子タイプ | DOI | |||||
URI | ||||||
識別子 | http://hdl.handle.net/2237/20779 | |||||
識別子タイプ | HDL |