{"_buckets": {"deposit": "8499cb7e-f997-462e-be34-e340ab6e23e6"}, "_deposit": {"id": "18684", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "18684"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00018684", "sets": ["322"]}, "author_link": ["54418", "54419"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2008-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "5", "bibliographicPageEnd": "158", "bibliographicPageStart": "149", "bibliographicVolumeNumber": "57", "bibliographic_titles": [{"bibliographic_title": "Journal of electron microscopy", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The demand for analysis of trace elements in atomically localized areas by electron energy-loss spectroscopy (EELS) in transmission electron microscopy is increasing. Unfortunately, the prolonged data acquisitions required to achieve an acceptable signal-to-noise ratio (SNR) tend to deteriorate the energy resolution because of spectral drifts due to instrumental instability. We developed a macroscript for a Gatan Digital MicrographTM to control an ENFINA 1000 EEL spectrometer that corrects for energy drifts during data accumulation. The script successfully achieved a core-loss spectrum for a sample having ∼1 at% elemental concentration, and provided a sufficient SNR for chemical state analysis.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1093/jmicro/dfn014"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/20779"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Oxford University Press", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1093/jmicro/dfn014", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "This is a pre-copyedited, author-produced PDF of an article accepted for publication in [Journal of electron microscopy] following peer review. The version of record [Journal of electron microscopy. v.57, n.5, 2008, p.149-158] is available online at: [http://dx.doi.org/10.1093/jmicro/dfn014].", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0022-0744", "subitem_source_identifier_type": "PISSN"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Sasano, Yusuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54418", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Muto, Shunsuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54419", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-21"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "JEM2008.pdf", "filesize": [{"value": "1.2 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 1200000.0, "url": {"label": "JEM2008.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/18684/files/JEM2008.pdf"}, "version_id": "07a45ac6-43a4-4755-8ae7-6dfb40898553"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "EELS", "subitem_subject_scheme": "Other"}, {"subitem_subject": "energy drift", "subitem_subject_scheme": "Other"}, {"subitem_subject": "DM script", "subitem_subject_scheme": "Other"}, {"subitem_subject": "trace elements", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/20779", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2014-11-17"}, "publish_date": "2014-11-17", "publish_status": "0", "recid": "18684", "relation": {}, "relation_version_is_last": true, "title": ["Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals"], "weko_shared_id": -1}