{"created":"2021-03-01T06:26:06.875108+00:00","id":18684,"links":{},"metadata":{"_buckets":{"deposit":"8499cb7e-f997-462e-be34-e340ab6e23e6"},"_deposit":{"id":"18684","owners":[],"pid":{"revision_id":0,"type":"depid","value":"18684"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00018684","sets":["320:321:322"]},"author_link":["54418","54419"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"158","bibliographicPageStart":"149","bibliographicVolumeNumber":"57","bibliographic_titles":[{"bibliographic_title":"Journal of electron microscopy","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The demand for analysis of trace elements in atomically localized areas by electron energy-loss spectroscopy (EELS) in transmission electron microscopy is increasing. Unfortunately, the prolonged data acquisitions required to achieve an acceptable signal-to-noise ratio (SNR) tend to deteriorate the energy resolution because of spectral drifts due to instrumental instability. We developed a macroscript for a Gatan Digital MicrographTM to control an ENFINA 1000 EEL spectrometer that corrects for energy drifts during data accumulation. The script successfully achieved a core-loss spectrum for a sample having ∼1 at% elemental concentration, and provided a sufficient SNR for chemical state analysis.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1093/jmicro/dfn014"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/20779"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Oxford University Press","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1093/jmicro/dfn014","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"This is a pre-copyedited, author-produced PDF of an article accepted for publication in [Journal of electron microscopy] following peer review. The version of record [Journal of electron microscopy. v.57, n.5, 2008, p.149-158] is available online at: [http://dx.doi.org/10.1093/jmicro/dfn014].","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"author"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0022-0744","subitem_source_identifier_type":"PISSN"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sasano, Yusuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54418","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Muto, Shunsuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54419","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-21"}],"displaytype":"detail","filename":"JEM2008.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"JEM2008.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/18684/files/JEM2008.pdf"},"version_id":"07a45ac6-43a4-4755-8ae7-6dfb40898553"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"EELS","subitem_subject_scheme":"Other"},{"subitem_subject":"energy drift","subitem_subject_scheme":"Other"},{"subitem_subject":"DM script","subitem_subject_scheme":"Other"},{"subitem_subject":"trace elements","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2014-11-17"},"publish_date":"2014-11-17","publish_status":"0","recid":"18684","relation_version_is_last":true,"title":["Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:07:31.391833+00:00"}