ログイン
Language:

WEKO3

  • トップ
  • ランキング
To
lat lon distance
To

Field does not validate



インデックスリンク

インデックスツリー

メールアドレスを入力してください。

WEKO

One fine body…

WEKO

One fine body…

アイテム

  1. B200 工学部/工学研究科
  2. B200a 雑誌掲載論文
  3. 学術雑誌

Clustering of germanium atoms in silica glass responsible for the 3.1 eV emission band studied by optical absorption and X-ray absorption fine structure analysis

http://hdl.handle.net/2237/20786
http://hdl.handle.net/2237/20786
59075a00-2ad3-4972-8584-9cc0658389f9
名前 / ファイル ライセンス アクション
JNM2009_Ge.pdf JNM2009_Ge.pdf (263.9 kB)
アイテムタイプ 学術雑誌論文 / Journal Article(1)
公開日 2014-11-17
タイトル
タイトル Clustering of germanium atoms in silica glass responsible for the 3.1 eV emission band studied by optical absorption and X-ray absorption fine structure analysis
言語 en
著者 Yoshida, Tomoko

× Yoshida, Tomoko

WEKO 54475

en Yoshida, Tomoko

Search repository
Muto, Shunsuke

× Muto, Shunsuke

WEKO 54476

en Muto, Shunsuke

Search repository
Yuliati, Leny

× Yuliati, Leny

WEKO 54477

en Yuliati, Leny

Search repository
Yoshida, Hisao

× Yoshida, Hisao

WEKO 54478

en Yoshida, Hisao

Search repository
Inada, Yasuhiro

× Inada, Yasuhiro

WEKO 54479

en Inada, Yasuhiro

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
権利情報 This is the author's version of a work that was accepted for publication in Journal of Nuclear Materials. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms, may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Nuclear Materials. v.386–388, 2009, p.1010–1013, DOI:10.1016/j.jnucmat.2008.12.201.
言語 en
抄録
内容記述タイプ Abstract
内容記述 Correlation between the 3.1 eV emission band and local atomic configuration was systematically examined for Ge+ implanted silica glass by UV–vis optical absorption spectroscopy and X-ray absorption fine structure (XAFS) analysis. The 2.7 eV emission band, commonly observed in defective silica, was replaced by the sharp and intense 3.1 eV emission band for the Ge+ fluence > 2 × 1016 cm−2, in which UV–vis absorption spectra suggested clustering of Ge atoms with the size ∼1 nm. XAFS spectroscopy indicated that the Ge atoms were under coordinated with oxygen atoms nearly at a neutral valence state on average. The present results are consistent with the previous ESR study but imply that the small Ge clusters rather than the O=Ge: complexes (point defects) are responsible for the 3.1 eV emission band.
言語 en
出版者
出版者 Elsevier
言語 en
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1016/j.jnucmat.2008.12.201
ISSN
収録物識別子タイプ PISSN
収録物識別子 0022-3115
書誌情報 en : Journal of Nuclear Materials

巻 386–388, p. 1010-1013, 発行日 2009-04
著者版フラグ
値 author
URI
識別子 http://dx.doi.org/10.1016/j.jnucmat.2008.12.201
識別子タイプ DOI
URI
識別子 http://hdl.handle.net/2237/20786
識別子タイプ HDL
戻る
0
views
See details
Views

Versions

Ver.1 2021-03-01 16:33:22.274160
Show All versions

Share

Share
tweet

Cite as

Other

print

エクスポート

OAI-PMH
  • OAI-PMH JPCOAR 2.0
  • OAI-PMH JPCOAR 1.0
  • OAI-PMH DublinCore
  • OAI-PMH DDI
Other Formats
  • JSON
  • BIBTEX
  • ZIP

コミュニティ

確認

確認

確認


Powered by WEKO3


Powered by WEKO3