{"created":"2021-03-01T06:26:09.829620+00:00","id":18730,"links":{},"metadata":{"_buckets":{"deposit":"b1841ec5-69dd-4ff9-95ba-1ae93951fcfa"},"_deposit":{"id":"18730","owners":[],"pid":{"revision_id":0,"type":"depid","value":"18730"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00018730","sets":["320:321:322"]},"author_link":["54585","54586","54587","54588","54589","54590","54591"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"024903","bibliographicPageStart":"024903","bibliographicVolumeNumber":"109","bibliographic_titles":[{"bibliographic_title":"Journal of Applied Physics","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The oxidation of submonolayer tin films on a Rh(111) surface by O2 gas was studied using low energy electron diffraction, Auger electron spectroscopy, x-ray photoemission spectroscopy(XPS), and scanning tunneling microscopy. A uniform tin oxide monolayer film formed at oxidation temperatures around 500 °C and a partial pressure of 2×10−7 mbar O2. The tin oxide film had (2×2) periodicity on the Rh(111) surface, and the resulting tin coverage was determined to be 0.5 ML. Using XPS, the compositional ratio O/Sn was determined to be 3/2. XPS spectra showed a single component for the Sn and O peaks, indicating a uniform bonding environment. Finally, ab initio density-functional theory total energy calculations and molecular dynamics simulations were performed using the projector augmented wave method to determine the detailed structure of the tin oxide thin film.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1063/1.3537871"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/20826"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP Publishing","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.3537871","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2011 American Institute of Physics","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0021-8979","subitem_source_identifier_type":"PISSN"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yuhara, J.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54585","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tajima, D.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54586","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsui, T.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54587","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tatsumi, K.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54588","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Muto, S.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54589","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Schmid, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54590","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Varga, P.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"54591","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-21"}],"displaytype":"detail","filename":"1_3537871.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"1_3537871.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/18730/files/1_3537871.pdf"},"version_id":"630d577b-9d76-4150-bd1f-3455de0bfcdf"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Tin","subitem_subject_scheme":"Other"},{"subitem_subject":"Thin film structure","subitem_subject_scheme":"Other"},{"subitem_subject":"Oxide surfaces","subitem_subject_scheme":"Other"},{"subitem_subject":"Scanning tunneling microscopy","subitem_subject_scheme":"Other"},{"subitem_subject":"Surface structure","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Growth and structure of an ultrathin tin oxide film on Rh (111)","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Growth and structure of an ultrathin tin oxide film on Rh (111)","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2014-11-18"},"publish_date":"2014-11-18","publish_status":"0","recid":"18730","relation_version_is_last":true,"title":["Growth and structure of an ultrathin tin oxide film on Rh (111)"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:07:32.694518+00:00"}