{"_buckets": {"deposit": "040b2d69-2de4-4307-926d-6e92b9258a66"}, "_deposit": {"id": "19042", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "19042"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00019042", "sets": ["322"]}, "author_link": ["55554", "55555", "55556", "55557", "55558", "55559", "55560", "55561", "55562", "55563", "55564", "55565", "55566", "55567", "55568", "55569"], "item_10_alternative_title_19": {"attribute_name": "その他のタイトル", "attribute_value_mlt": [{"subitem_alternative_title": "Development of a High-Voltage Electron Microscope for Reaction Science", "subitem_alternative_title_language": "en"}]}, "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2011", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "3", "bibliographicPageEnd": "159", "bibliographicPageStart": "156", "bibliographicVolumeNumber": "46", "bibliographic_titles": [{"bibliographic_title": "顕微鏡", "bibliographic_titleLang": "ja"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "近年，電子顕微鏡の分野では，球面収差補正装置を使ったサブÅの超高分解能の実現とあわせ，ガス雰囲気や各種の機械的・電気的変調を加えながら試料の観察を行う「環境電子顕微鏡（Environmental TEM/STEM; ETEM/ESTEM）」が話題になっている．今回名古屋大学では世界に先駆けて10,000Pa（≅1/10気圧）までガスを入れたり，光や機械的変調を試料に加えられ，かつ3次元観察もできる100万ボルト超高圧電子顕微鏡を開発・設置した．本稿ではその開発の詳細と初期的データを説明する．", "subitem_description_language": "ja", "subitem_description_type": "Abstract"}, {"subitem_description": "Recently, the environmental transmission electron microscopy (ETEM) is highlighted as well as ultra-high resolution transmission electron microscopy with spherical aberration correction. Various kinds of in-situ observations of specimens changed by physical, electrical and mechanical modulations are carried out in the ETEM. In 2010 Nagoya University installed the world-first environmental high-voltage electron microscope, where observations under gas-injection up to 10,000Pa (≅1/10 atmosphere), light and mechanical modulations and three-dimensional tomography are performed for thicker specimens. In this article, the background of development and the preliminary data by using the instrument are reported.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "URI", "subitem_identifier_uri": "http://www.microscopy.or.jp/magazine/46_3/contents.html"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/21128"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "公益社団法人日本顕微鏡学会", "subitem_publisher_language": "ja"}]}, "item_10_relation_43": {"attribute_name": "関連情報", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://www.microscopy.or.jp/magazine/46_3/contents.html", "subitem_relation_type_select": "URI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "著作権は公益社団法人日本顕微鏡学会が所有する", "subitem_rights_language": "ja"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1349-0958", "subitem_source_identifier_type": "PISSN"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "田中, 信夫", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "55554", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "臼倉, 治郎", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "55555", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "楠, 美智子", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "55556", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "斎藤, 弥八", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "55557", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "佐々木, 勝寛", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "55558", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "丹司, 敬義", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "55559", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "武藤, 俊介", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "55560", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "荒井, 重勇", "creatorNameLang": "ja"}], "nameIdentifiers": 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