{"created":"2021-03-01T06:26:30.028541+00:00","id":19042,"links":{},"metadata":{"_buckets":{"deposit":"040b2d69-2de4-4307-926d-6e92b9258a66"},"_deposit":{"id":"19042","owners":[],"pid":{"revision_id":0,"type":"depid","value":"19042"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00019042","sets":["320:321:322"]},"author_link":["55554","55555","55556","55557","55558","55559","55560","55561","55562","55563","55564","55565","55566","55567","55568","55569"],"item_10_alternative_title_19":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Development of a High-Voltage Electron Microscope for Reaction Science","subitem_alternative_title_language":"en"}]},"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"159","bibliographicPageStart":"156","bibliographicVolumeNumber":"46","bibliographic_titles":[{"bibliographic_title":"顕微鏡","bibliographic_titleLang":"ja"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"近年，電子顕微鏡の分野では，球面収差補正装置を使ったサブÅの超高分解能の実現とあわせ，ガス雰囲気や各種の機械的・電気的変調を加えながら試料の観察を行う「環境電子顕微鏡（Environmental TEM/STEM; ETEM/ESTEM）」が話題になっている．今回名古屋大学では世界に先駆けて10,000Pa（≅1/10気圧）までガスを入れたり，光や機械的変調を試料に加えられ，かつ3次元観察もできる100万ボルト超高圧電子顕微鏡を開発・設置した．本稿ではその開発の詳細と初期的データを説明する．","subitem_description_language":"ja","subitem_description_type":"Abstract"},{"subitem_description":"Recently, the environmental transmission electron microscopy (ETEM) is highlighted as well as ultra-high resolution transmission electron microscopy with spherical aberration correction. Various kinds of in-situ observations of specimens changed by physical, electrical and mechanical modulations are carried out in the ETEM. In 2010 Nagoya University installed the world-first environmental high-voltage electron microscope, where observations under gas-injection up to 10,000Pa (≅1/10 atmosphere), light and mechanical modulations and three-dimensional tomography are performed for thicker specimens. In this article, the background of development and the preliminary data by using the instrument are reported.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"URI","subitem_identifier_uri":"http://www.microscopy.or.jp/magazine/46_3/contents.html"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/21128"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"公益社団法人日本顕微鏡学会","subitem_publisher_language":"ja"}]},"item_10_relation_43":{"attribute_name":"関連情報","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.microscopy.or.jp/magazine/46_3/contents.html","subitem_relation_type_select":"URI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"著作権は公益社団法人日本顕微鏡学会が所有する","subitem_rights_language":"ja"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-0958","subitem_source_identifier_type":"PISSN"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"田中, 信夫","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55554","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"臼倉, 治郎","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55555","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"楠, 美智子","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55556","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"斎藤, 弥八","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55557","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐々木, 勝寛","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55558","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"丹司, 敬義","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55559","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"武藤, 俊介","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55560","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"荒井, 重勇","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"55561","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tanaka, Nobuo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55562","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Usukura, Jiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55563","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kusunoki, Michiko","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55564","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saito, Yahachi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55565","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Katuhiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55566","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tanji, Takayoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55567","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Muto, Shunsuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55568","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Arai, Shigeo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"55569","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-21"}],"displaytype":"detail","filename":"46-3-156.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"46-3-156.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/19042/files/46-3-156.pdf"},"version_id":"49c229fe-bb24-4b74-9568-c9647ed0e7aa"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"環境超高圧電子顕微鏡","subitem_subject_scheme":"Other"},{"subitem_subject":"反応科学研究","subitem_subject_scheme":"Other"},{"subitem_subject":"その場観察","subitem_subject_scheme":"Other"},{"subitem_subject":"3次元観察","subitem_subject_scheme":"Other"},{"subitem_subject":"TEM/STEM","subitem_subject_scheme":"Other"},{"subitem_subject":"Environmental high-voltage electron microscope","subitem_subject_scheme":"Other"},{"subitem_subject":"Reaction science","subitem_subject_scheme":"Other"},{"subitem_subject":"Three-dimensional observation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"反応科学超高圧電子顕微鏡の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"反応科学超高圧電子顕微鏡の開発","subitem_title_language":"ja"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2015-01-26"},"publish_date":"2015-01-26","publish_status":"0","recid":"19042","relation_version_is_last":true,"title":["反応科学超高圧電子顕微鏡の開発"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:08:00.255039+00:00"}