{"created":"2021-03-01T06:08:17.397901+00:00","id":1910,"links":{},"metadata":{"_buckets":{"deposit":"487076c0-0f3a-40c9-b161-49922a7cbc29"},"_deposit":{"created_by":17,"id":"1910","owners":[17],"pid":{"revision_id":0,"type":"depid","value":"1910"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00001910","sets":["323:350:373:381"]},"author_link":["4667","4668","4669","4670","4671","4672"],"item_1615768549627":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_9_alternative_title_19":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"A STUDY OF TEST BATTERY FOR DIAGNOSING ACADEMIC ACHIEVEMENT OF ELEMENTARY SCHOOL CHILDREN : A Multivariate Approach","subitem_alternative_title_language":"en"}]},"item_9_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1971-03-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"45","bibliographicPageStart":"21","bibliographicVolumeNumber":"17","bibliographic_titles":[{"bibliographic_title":"名古屋大學教育學部紀要. 教育心理学科","bibliographic_titleLang":"ja"}]}]},"item_9_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In order to diagnose academic achievement of forth-to sixth-grade children, a test battery composed of four single tests was constructed : an achievement test of national language, an achievement test, of arithmetics, an intelligence test, and an inventory for studying conditions. The last one was developed to find out variables affecting children's \"achievement score, \" which is caliculated on the basis of the regression of the scores of the achievement tests to the score of the intelligence test. Data obtained were treated by means of factor analysis and multiple regression analysis. Major findings are as followes : from 10 to 25% of variance of the achievement score may be explained in terms of variables contained in the inventory. Variables which are positively related to the \"achievement score\" are economic status of the family, children's achievement motive, skill of studying, freedom from general and test anxiety, and parental acceptance.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_9_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"国立情報学研究所で電子化したコンテンツを使用している。","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_9_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/3333"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.18999/bulfep.17.21","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋大学教育学部","subitem_publisher_language":"ja"}]},"item_9_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_9_source_id_7":{"attribute_name":"ISSN（print）","attribute_value_mlt":[{"subitem_source_identifier":"03874796","subitem_source_identifier_type":"PISSN"}]},"item_9_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"塩田, 芳久","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"4667","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"SHIOTA, Yoshihisa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4668","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大橋, 正夫","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"4669","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"OHASHI, Masao","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4670","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小森, 孝彦","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"4671","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"KOMORI, Takahiko","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"4672","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-16"}],"displaytype":"detail","filename":"KJ00000136826.pdf","filesize":[{"value":"2.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00000136826.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/1910/files/KJ00000136826.pdf"},"version_id":"c6cd5787-94ff-4a08-9c99-e8819d2128ad"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"<共同研究>学力診断のためのテスト・バッテリーの研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"<共同研究>学力診断のためのテスト・バッテリーの研究","subitem_title_language":"ja"}]},"item_type_id":"9","owner":"17","path":["381"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-01-06"},"publish_date":"2006-01-06","publish_status":"0","recid":"1910","relation_version_is_last":true,"title":["<共同研究>学力診断のためのテスト・バッテリーの研究"],"weko_creator_id":"17","weko_shared_id":-1},"updated":"2023-11-09T02:42:37.644577+00:00"}