{"created":"2021-03-01T06:30:33.629620+00:00","id":22767,"links":{},"metadata":{"_buckets":{"deposit":"9793b44e-565f-4c5d-8e1b-b25fd88fb38b"},"_deposit":{"id":"22767","owners":[],"pid":{"revision_id":0,"type":"depid","value":"22767"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00022767","sets":["673:674:675"]},"author_link":["67020","67021","67022","67023","67024","67025","67026","67027","67028","67029"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"013108","bibliographicPageStart":"013108","bibliographicVolumeNumber":"109","bibliographic_titles":[{"bibliographic_title":"Applied Physics Letters","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The space charge effect has been clearly observed in the energy distributions of picosecond pulse beams from a spin-polarized electron microscope, and was found to depend upon the quantity of charge per pulse. The non-linear phenomena associated with this effect have also been replicated in beam simulations that take into account of a three-dimensional space charge. The results show that a charge of 500 aC/pulse provides the highest brightness with a 16-ps pulse duration, a 30-keV beam energy, and an emission spot of 1.8 μm. Furthermore, the degeneracy of the wave packet of the pulsed electron beam has been evaluated to be 1.6 × 10−5 with a charge of 100 aC/pulse, which is higher than that for a continuously emitted electron beam despite the low beam energy of 30 keV. The high degeneracy and high brightness contribute to the realization of high temporal and energy resolutions in low-voltage electron microscopy, which will serve to reduce radiolysis damage and enhance scattering contrast.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://doi.org/10.1063/1.4955457"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/24926"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP Publishing","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.4955457","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0003-6951","subitem_source_identifier_type":"PISSN"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kuwahara, Makoto","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67020","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nambo, Yoshito","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67021","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Aoki, Kota","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67022","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sameshima, Kensuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67023","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Jin, Xiuguang","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67024","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ujihara, Toru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67025","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Asano, Hidefumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67026","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saitoh, Koh","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67027","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takeda, Yoshikazu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67028","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tanaka, Nobuo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67029","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-22"}],"displaytype":"detail","filename":"1_4955457.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"1_4955457.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/22767/files/1_4955457.pdf"},"version_id":"ae0440a2-73d4-44f8-8eeb-e54ab55b3381"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"The Boersch effect in a picosecond pulsed electron beam emitted from a semiconductor photocathode","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"The Boersch effect in a picosecond pulsed electron beam emitted from a semiconductor photocathode","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["675"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2016-09-29"},"publish_date":"2016-09-29","publish_status":"0","recid":"22767","relation_version_is_last":true,"title":["The Boersch effect in a picosecond pulsed electron beam emitted from a semiconductor photocathode"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:46:07.228929+00:00"}