{"created":"2021-03-01T06:30:54.406064+00:00","id":23082,"links":{},"metadata":{"_buckets":{"deposit":"975baa56-28af-481d-a698-9a4fc6a4773c"},"_deposit":{"id":"23082","owners":[],"pid":{"revision_id":0,"type":"depid","value":"23082"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00023082","sets":["320:321:322"]},"author_link":["68396","68397","68398","68399"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-04-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"1869","bibliographicPageStart":"1858","bibliographicVolumeNumber":"53","bibliographic_titles":[{"bibliographic_title":"Journal of Nuclear Science and Technology","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A new technique to reduce discretization errors for ray tracing in the method of characteristics (MOC) is proposed focusing on depletion calculations of single and multi-assembly geometries. In order to efficiently carry out depletion calculations, a calculation scheme using the superhomogenization (SPH) method can be used. However, the discretization errors are caused by changes of neutron sources and total cross sections according to a depletion. This fact means that improvement of accuracy cannot be expected by the calculation scheme with the SPH method when changes of the above parameters are significant. In order to mitigate this problem, a new approach is developed. In the new approach, the discretization errors are reduced by minimizing a variance of a certain parameter which is composed of a ratio of neutron source to total cross section. The verification results suggest that accuracy is degraded by the SPH method as expected especially in a geometry where neutron sources and total cross sections are drastically changing through a depletion. On the other hand, the new approach gives more accurate results compared to the conventional MOC in all calculation cases. Consequently, improvement of calculation efficiency by the new approach is confirmed.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"DOI","subitem_identifier_uri":"http://dx.doi.org/10.1080/00223131.2016.1171172"},{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/25272"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Taylor & Francis","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1080/00223131.2016.1171172","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"This is an Accepted Manuscript of an article published by Taylor & Francis Group in Journal of Nuclear Science and Technology on 20/04/2016, available online: http://www.tandfonline.com/10.1080/00223131.2016.1171172","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"author"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0022-3131","subitem_source_identifier_type":"PISSN"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tabuchi, Masato","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"68396","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamamoto, Akio","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"68397","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Endo, Tomohiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"68398","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tatsumi, Masahiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"68399","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-20"}],"displaytype":"detail","filename":"JNST_53_11_pp1858-1869.pdf","filesize":[{"value":"957.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"JNST_53_11_pp1858-1869.pdf ファイル公開：2017/04/20","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/23082/files/JNST_53_11_pp1858-1869.pdf"},"version_id":"a9954669-845e-4b82-a2d6-b26b1b843216"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Reactor physics","subitem_subject_scheme":"Other"},{"subitem_subject":"method of characteristics","subitem_subject_scheme":"Other"},{"subitem_subject":"numerical analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"discretization error","subitem_subject_scheme":"Other"},{"subitem_subject":"depletion calculation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Reduction of MOC discretization errors through a minimization of source ratio variances","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Reduction of MOC discretization errors through a minimization of source ratio variances","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2016-12-20"},"publish_date":"2016-12-20","publish_status":"0","recid":"23082","relation_version_is_last":true,"title":["Reduction of MOC discretization errors through a minimization of source ratio variances"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:12:47.241927+00:00"}