@article{oai:nagoya.repo.nii.ac.jp:00027066,
 author = {Itoh, Shigeyasu and Nakaji, Masaya and Uchida, Yuya and Kitaguchi, Masaaki and Shimizu, Hirohiko M.},
 journal = {Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment},
 month = {Nov},
 note = {Pendellösung interferometry is one of the technique for accurate determination of the structure factors of crystals. Observation method of Pendellösung fringes by using pulsed cold neutrons and the time-of-flight analysis were established. We measured the nuclear scattering length of silicon by the Pendellösung fringes with pulsed neutrons as (4.125±0.003(stat:)±0:028(syst:)). This indicates the applicability of Pendellösung interferometry at high-intensity pulsed neutron facilities for various precision measurements., ファイル公開：2020-11-11, Corrigendum to “Pendellösung interferometry by using pulsed neutrons” [Nucl. Instrum. Methods Phys. Res. A 908 (2018) 78–81]: https://doi.org/10.1016/j.nima.2018.10.218 (http://hdl.handle.net/2237/29267)},
 pages = {78--81},
 title = {Pendellösung interferometry by using pulsed neutrons},
 volume = {908},
 year = {2018}
}