{"created":"2021-03-01T06:36:43.191517+00:00","id":28614,"links":{},"metadata":{"_buckets":{"deposit":"d71549e9-559a-4cf2-b888-cb04af58a1af"},"_deposit":{"id":"28614","owners":[],"pid":{"revision_id":0,"type":"depid","value":"28614"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00028614","sets":["312:313:314"]},"author_link":["93691","93692"],"control_number":"28614","item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicPageEnd":"877","bibliographicPageStart":"867","bibliographicVolumeNumber":"102","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Adaptive voltage scaling is a promising approach to overcome manufacturing variability, dynamic environmental fluctuation, and aging. This paper focuses on error prediction based adaptive voltage scaling (EP-AVS) and proposes a mean time to failure (MTTF) aware design methodology for EP-AVS circuits. Main contributions of this work include (1) optimization of both voltage-scaled circuit and voltage control logic, and (2) quantitative evaluation of power saving for practically long MTTF. Experimental results show that the proposed EP-AVS design methodology achieves 38.0% power saving while satisfying given target MTTF.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"一般社団法人 電子情報通信学会","subitem_publisher_language":"ja"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1587/transfun.E102.A.867","subitem_relation_type_select":"DOI"}}]},"item_10_relation_43":{"attribute_name":"関連情報","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.ieice.org/jpn/books/transaction.html","subitem_relation_type_select":"URI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright©2019 IEICE","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_61":{"attribute_name":"ISSN（print）","attribute_value_mlt":[{"subitem_source_identifier":"0916-8508","subitem_source_identifier_type":"PISSN"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"MASUDA, Yutaka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"93691","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"HASHIMOTO, Masanori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"93692","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-10-15"}],"displaytype":"detail","filename":"e102-a_7_867.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"e102-a_7_867","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/28614/files/e102-a_7_867.pdf"},"version_id":"e64b12e3-e74c-4f41-aa14-c26398260b41"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"adaptive voltage scaling","subitem_subject_scheme":"Other"},{"subitem_subject":"activation-aware slack assignment","subitem_subject_scheme":"Other"},{"subitem_subject":"mean time to failure","subitem_subject_scheme":"Other"},{"subitem_subject":"timing error predictive FF","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"MTTF-Aware Design Methodology of Adaptively Voltage Scaled Circuit with Timing Error Predictive Flip-Flop","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"MTTF-Aware Design Methodology of Adaptively Voltage Scaled Circuit with Timing Error Predictive Flip-Flop","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["314"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2019-10-15"},"publish_date":"2019-10-15","publish_status":"0","recid":"28614","relation_version_is_last":true,"title":["MTTF-Aware Design Methodology of Adaptively Voltage Scaled Circuit with Timing Error Predictive Flip-Flop"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:21:31.265507+00:00"}