{"created":"2021-03-01T06:36:46.588284+00:00","id":28667,"links":{},"metadata":{"_buckets":{"deposit":"29b470ac-9868-4c84-aa98-dc455a45e1a0"},"_deposit":{"id":"28667","owners":[],"pid":{"revision_id":0,"type":"depid","value":"28667"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00028667","sets":["673:674:675"]},"author_link":["94101","94102"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-02","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageStart":"023501","bibliographicVolumeNumber":"82","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A combination of helium line intensities and a collisional radiative model has been used to measure electron density and temperature. However, radiation trapping of resonance lines may disturb the measurements due to disturbances in the population distribution of helium atoms. In this study, we show that the principal contribution of radiation trapping in helium plasma can be evaluated by additionally measuring one or two specific line intensities from the singlet state. The inclusion of the effects of radiation trapping sufficiently compensates for anomalous increases in the electron density and temperature, and consequently yields proper values. An experiment was performed in the divertor simulator NAGDIS-II, and the method's validity was confirmed by comparing the spectroscopically obtained results and the values from the electrostatic probe method.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP Publishing","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.3548923","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.The following article appeared in (Review of Scientific Instruments. v.82, n.2, 2011, p.023501) and may be found at (http://dx.doi.org/10.1063/1.3548923).","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_61":{"attribute_name":"ISSN（print）","attribute_value_mlt":[{"subitem_source_identifier":"0034-6748","subitem_source_identifier_type":"PISSN"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kajita, Shin","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"94101","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ohno, Noriyasu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"94102","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-11-07"}],"displaytype":"detail","filename":"1_3548923.pdf","filesize":[{"value":"443.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"1_3548923","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/28667/files/1_3548923.pdf"},"version_id":"5716c9b3-d9a2-486f-bc68-599913390bc6"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Practical selection of emission lines of He I to determine the photon absorption rate","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Practical selection of emission lines of He I to determine the photon absorption rate","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["675"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2019-11-07"},"publish_date":"2019-11-07","publish_status":"0","recid":"28667","relation_version_is_last":true,"title":["Practical selection of emission lines of He I to determine the photon absorption rate"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:21:12.544913+00:00"}