@article{oai:nagoya.repo.nii.ac.jp:00031284, author = {Fujii, Toshitaka and Uchiyama, Susumu}, issue = {1}, journal = {Memoirs of the Faculty of Engineering, Nagoya University}, month = {Sep}, note = {Recently, extensive studies have been made on the magnetic properties of thin Permalloy films because of their usefulness to memory devices of high speed digital computers. In order to elucidate the magnetization mechanism of any magnetic materials, the observation of the domain structures is one of the most fundamental and indispensable means. Therefore, many works have been carried out about the domain structure both of single crystalline and of polycrystalline ferromagnetic films. As a result, various types of domain walls were found such as Bloch wall, Néel wall, cross-tie wall and chain wall. In course of our study on static reversal processes of the thin Permalloy films, we found a few new types of the walls which will be shown in the following.}, pages = {67--73}, title = {Domain walls along line defects in thin permalloy films}, volume = {17}, year = {1965} }