{"created":"2021-03-01T06:11:42.936852+00:00","id":5169,"links":{},"metadata":{"_buckets":{"deposit":"bf694bca-6294-42c7-a28b-e900a37d48e7"},"_deposit":{"id":"5169","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5169"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005169","sets":["320:321:322"]},"author_link":["12956","12957","12958","12959","12960"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"392","bibliographicPageStart":"385","bibliographicVolumeNumber":"6","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Dielectrics and Electrical Insulation [see also IEEE Transactions on Electrical Insulation]","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have been studying quench-induced 'dynamic' breakdown characteristics of LHe * and have already found that the electrical insulation performance of LHe was degraded drastically by the thermal bubble disturbance due to quench of superconductors. In this paper, in order to improve the insulation performance of LHe under quench conditions, we measured dynamic breakdown and prebreakdown characteristics of pressurized LHe. Experimental results revealed that breakdown voltage of LHe under quench conditions at 0.2 MPa was greatly improved, reaching 2 to 4x compared with that at atmospheric pressure under both uniform and non-uniform electric fields. Moreover, for practical and efficient insulation design of superconducting power apparatus, we investigated the dynamic breakdown voltage of LHe as functions of' pressure and gap length.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/6753"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/94.775627","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 1999 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1070-9878","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Chigusa, S.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12956","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Maeda, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12957","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Taniguchi, Y.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12958","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayakawa, N.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12959","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12960","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"00775627.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"00775627.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5169/files/00775627.pdf"},"version_id":"f5ae4af5-7fcc-413a-b97b-39c7156d6a5f"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Insulation performance of pressurized liquid helium under quench-induced thermal bubble disturbance for superconducting power apparatus","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Insulation performance of pressurized liquid helium under quench-induced thermal bubble disturbance for superconducting power apparatus","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-07-28"},"publish_date":"2006-07-28","publish_status":"0","recid":"5169","relation_version_is_last":true,"title":["Insulation performance of pressurized liquid helium under quench-induced thermal bubble disturbance for superconducting power apparatus"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:49:45.025802+00:00"}