{"created":"2021-03-01T06:11:43.223886+00:00","id":5173,"links":{},"metadata":{"_buckets":{"deposit":"0b7a5221-791c-4d02-a1e2-8916d2fc429c"},"_deposit":{"id":"5173","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5173"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005173","sets":["320:321:322"]},"author_link":["12975","12976","12977"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-03","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"1521","bibliographicPageStart":"1518","bibliographicVolumeNumber":"10","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Applied Superconductivity","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this paper, we measured quench-induced dynamic breakdown strength  of liquid helium (LHe) under various quench environment of superconducting (SC) coils for electrical insulation designs of SC power equipment. Experimental results revealed that the dynamic breakdown strength of LHe drastically decreased with even small post-quench thermal energy of SC coils. However, the dynamic breakdown strength was improved with the increase in the pressure of LHe because of the suppression of thermal bubble disturbance in LHe. Moreover, we established 3 dimensional diagrams of the dynamic breakdown strength of LHe as a function of effective post-quench thermal energy density and pressure of LHe. The diagrams are applicable to the practical insulation design of SC equipment under quench environment.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/6763"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/77.828530","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2000 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1051-8223","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Chigusa, S.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12975","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayakawa, N.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12976","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12977","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"00828530.pdf","filesize":[{"value":"390.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"00828530.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5173/files/00828530.pdf"},"version_id":"7ff7c8e9-89fb-43f3-9efc-aae6bd8da89d"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"quench","subitem_subject_scheme":"Other"},{"subitem_subject":"breakdown strength","subitem_subject_scheme":"Other"},{"subitem_subject":"insulation design","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Quench-induced dynamic breakdown strength of liquid helium for superconducting coils","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Quench-induced dynamic breakdown strength of liquid helium for superconducting coils","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-07-31"},"publish_date":"2006-07-31","publish_status":"0","recid":"5173","relation_version_is_last":true,"title":["Quench-induced dynamic breakdown strength of liquid helium for superconducting coils"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:49:45.374388+00:00"}