{"created":"2021-03-01T06:11:44.161529+00:00","id":5188,"links":{},"metadata":{"_buckets":{"deposit":"818dd1a8-dc20-4044-bd48-cca897df328c"},"_deposit":{"id":"5188","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5188"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005188"},"item_10_biblio_info_6":{"attribute_name":"\u66f8\u8a8c\u60c5\u5831","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"1805","bibliographicPageStart":"1802","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Applied Superconductivity"}]}]},"item_10_description_4":{"attribute_name":"\u6284\u9332","attribute_value_mlt":[{"subitem_description":"We have discussed dielectric characteristics of liquid nitrogen (LN2)/polypropylene (PP) laminated paper composite insulation system for the practical electrical insulation design of high temperature superconducting (HTS) cables. Focusing on the partial discharge (PD) inception characteristics and mechanism, the volume effect and its saturation on PD inception electric field strength (PDIE) was evaluated at atmospheric and pressurized condition. PD inception characteristics under lightning impulse voltage application were also investigated using an electrical and optical PD measuring system, and compared with those under ac voltage application.","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/6772"}]},"item_10_publisher_32":{"attribute_name":"\u51fa\u7248\u8005","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1109/TASC.2005.849292","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"\u6a29\u5229","attribute_value_mlt":[{"subitem_rights":"Copyright \u00a9 2005 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University\u2019s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org."}]},"item_10_select_15":{"attribute_name":"\u8457\u8005\u7248\u30d5\u30e9\u30b0","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1051-8223","subitem_source_identifier_type":"ISSN"}]},"item_10_text_14":{"attribute_name":"\u30d5\u30a9\u30fc\u30de\u30c3\u30c8","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_creator":{"attribute_name":"\u8457\u8005","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hayakawa, N."}],"nameIdentifiers":[{"nameIdentifier":"13020","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nagino, M."}],"nameIdentifiers":[{"nameIdentifier":"13021","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kojima, H."}],"nameIdentifiers":[{"nameIdentifier":"13022","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Goto, M."}],"nameIdentifiers":[{"nameIdentifier":"13023","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takahashi, T."}],"nameIdentifiers":[{"nameIdentifier":"13024","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yasuda, K."}],"nameIdentifiers":[{"nameIdentifier":"13025","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, H."}],"nameIdentifiers":[{"nameIdentifier":"13026","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"\u30d5\u30a1\u30a4\u30eb\u60c5\u5831","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"01440002.pdf","filesize":[{"value":"400.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"01440002.pdf","url":"https://nagoya.repo.nii.ac.jp/record/5188/files/01440002.pdf"},"version_id":"0180d550-2388-4475-8608-d9a93e2b1f45"}]},"item_keyword":{"attribute_name":"\u30ad\u30fc\u30ef\u30fc\u30c9","attribute_value_mlt":[{"subitem_subject":"High temperature superconducting cable","subitem_subject_scheme":"Other"},{"subitem_subject":"partial","subitem_subject_scheme":"Other"},{"subitem_subject":"discharge","subitem_subject_scheme":"Other"},{"subitem_subject":"statistical stressed liquid volume","subitem_subject_scheme":"Other"},{"subitem_subject":"volume effect","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"\u8a00\u8a9e","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"\u8cc7\u6e90\u30bf\u30a4\u30d7","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Dielectric characteristics of HTS cables based on partial discharge measurement","item_titles":{"attribute_name":"\u30bf\u30a4\u30c8\u30eb","attribute_value_mlt":[{"subitem_title":"Dielectric characteristics of HTS cables based on partial discharge measurement"}]},"item_type_id":"10","owner":"1","path":["320/321/322"],"pubdate":{"attribute_name":"\u516c\u958b\u65e5","attribute_value":"2006-08-01"},"publish_date":"2006-08-01","publish_status":"0","recid":"5188","relation_version_is_last":true,"title":["Dielectric characteristics of HTS cables based on partial discharge measurement"],"weko_creator_id":"1","weko_shared_id":3},"updated":"2021-03-01T13:16:31.069807+00:00"}