{"created":"2021-03-01T06:11:44.511263+00:00","id":5191,"links":{},"metadata":{"_buckets":{"deposit":"21aa931d-25ea-4d94-b411-c8a2f92881ca"},"_deposit":{"id":"5191","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5191"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005191","sets":["320:321:322"]},"author_link":["13044","13045","13046","13047","13048"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageEnd":"2813","bibliographicPageStart":"2811","bibliographicVolumeNumber":"41","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Magnetics","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper reports the magnetic, electrical, and microstructural properties of epitaxial thin films with an ordered double-perovskite structure. Sr2 FeMoO6 (SFMO) and Sr2 CrReO6 (SCRO) films have been grown by sputtering onto the lattice-matched substrates of Ba0.4 Sr0.6 TiO3 -buffered and bare SrTiO3, respectively. These films exhibit high saturation magnetization Ms values (3.8μB/f.u. for SFMO and 0.9μB/f.u. for SCRO), which are close to the expected values for their half-metallicity, and high curie temperature Tc values (385 K for SFMO and 620 K for SCRO). Surface analyzes by AFM and XPS indicate that these films have atomically flat and well-defined surfaces, which are free from any surface precipitates. This enables us to employ a standard photolithographic process for fabricating magnetic tunnel junctions based on these films. SFMO junctions with a native barrier formed by surface oxidation of a SFMO base-electrode and a Co counterelectrode have shown a tunnel magnetoresistance ratio of 10% at 4.2 K.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/6775"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TMAG.2005.854836","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2005 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Asano, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13044","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Koduka, N.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13045","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Imaeda, K.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13046","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sugiyama, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13047","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsui, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13048","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"01519130.pdf","filesize":[{"value":"112.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"01519130.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5191/files/01519130.pdf"},"version_id":"c43b5e88-7ff1-4731-8b6b-7b34ab3f7860"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Double perovskite","subitem_subject_scheme":"Other"},{"subitem_subject":"epitaxial film","subitem_subject_scheme":"Other"},{"subitem_subject":"half-metallic feromagnet","subitem_subject_scheme":"Other"},{"subitem_subject":"magnetic tunnel junction","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Magnetic and junction properties of half-metallic double-perovskite thin films","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Magnetic and junction properties of half-metallic double-perovskite thin films","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-08-01"},"publish_date":"2006-08-01","publish_status":"0","recid":"5191","relation_version_is_last":true,"title":["Magnetic and junction properties of half-metallic double-perovskite thin films"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:49:50.114018+00:00"}