{"created":"2021-03-01T06:11:44.572015+00:00","id":5192,"links":{},"metadata":{"_buckets":{"deposit":"f0e85b6a-97b6-426e-bdf1-12b10d36e4e8"},"_deposit":{"id":"5192","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5192"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005192","sets":["320:321:322"]},"author_link":["13049","13050","13051","13052","13053","13054"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"2730","bibliographicPageStart":"2727","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Applied Superconductivity","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Critical current density (Jc), irreversibility field (Birr) and microstructure in epitaxial SmBa2Cu3O7-x (SmBCO) films are reported.We have developed a novel approach to deposit high performance Sm1+xBa2-xCu3O6+y (Sm-123) at relatively low substrate temperature on MgO. The use of thin SmBCO seed layer grown at a high substrate temperature enabled us to obtain fully -axis oriented SmBCO films with high critical current density (Jc) of 2.8×10＾5 A/cm2 under 5 T for B//c at 77 K. This value is as high as in the optimized NbTi superconducting wires achieved for 5 T at 4.2 K. Compared with YBa2Cu3O7-y films, Sm-123 films showed higher Jc in high fields at 77 K. Transmission electron microscopy TEM analyses clarified the Sm/Ba composition ratio fluctuations in the Sm-123 matrix composition in the range of x = 0～0.14 with a wavelength of 50～100 nm.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/6776"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TASC.2005.847798","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2005 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1051-8223","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yoshida, Yutaka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13049","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ichino, Yusuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13050","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Miura, Masashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13051","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takai, Yoshiaki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13052","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsumoto, Kaname","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13053","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ichinose, Ataru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13054","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"01440231.pdf","filesize":[{"value":"513.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"01440231.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5192/files/01440231.pdf"},"version_id":"1a8fe349-8b60-4f59-b7fe-2baed270a506"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Magnetic field measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"superconducting film","subitem_subject_scheme":"Other"},{"subitem_subject":"superconducting wires","subitem_subject_scheme":"Other"},{"subitem_subject":"thin films","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"High critical current density in high field in Sm/sub 1+x/Ba/sub 2-x/Cu/sub 3/O/sub 6+y/ thin films","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"High critical current density in high field in Sm/sub 1+x/Ba/sub 2-x/Cu/sub 3/O/sub 6+y/ thin films","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-08-01"},"publish_date":"2006-08-01","publish_status":"0","recid":"5192","relation_version_is_last":true,"title":["High critical current density in high field in Sm/sub 1+x/Ba/sub 2-x/Cu/sub 3/O/sub 6+y/ thin films"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:49:50.200513+00:00"}