{"created":"2021-03-01T06:11:44.633313+00:00","id":5193,"links":{},"metadata":{"_buckets":{"deposit":"b6e07214-21a9-441a-ba54-9e5f705002f6"},"_deposit":{"id":"5193","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5193"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005193","sets":["320:321:322"]},"author_link":["13055","13056","13057","13058","13059","13060","13061","13062","13063"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"3081","bibliographicPageStart":"3078","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Applied Superconductivity","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have reported superconducting properties of Sm1+xBa2-xCu3Oy (SmBCO; x = 0.08) thin films prepared by the low temperature growth technique (LTG). LTG process is consisted of two steps as follows; a seed layer is deposited at 830℃ on MgO(100), and then upper layer is deposited at 740－780℃ on the seed layer. In order to investigate the effect of the fluctuations Sm/Ba composition ratio in the SmBCO matrix, we deposited upper layer with the Sm/Ba composition of x = 0-0.12. The SmBCO films with x = 0.04 and 0.08 show critical current density (Jc) at 77 K of up to 5×10^6 A /cm2 under 0 T and 1×10^5 A /cm2 under 5 T for B//c at 77 K, respectively. The Jc of x = 0.12 film dropped more sharply compared with the cases of x = 0.04 and 0.08 films. From the microstructure analysis, it was found that the main phase of x = 0.12 film was Sm-rich (Sm1.1Ba1.9Cu3Oy) phase, while that of x = 0.04 and 0.08 films was stoichiometry. We speculated that the low-Jc of x = 0.12 film in the magnetic fields was ascribed to the low physical meters of Tc and irreversibility field of the Sm-rich SmBCO main phase.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/6778"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TASC.2005.848962","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2005 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1051-8223","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Miura, Masashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13055","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Itoh, Masakazu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13056","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ichino, Yusuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13057","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yoshida, Yutaka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13058","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takai, Yoshiaki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13059","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsumoto, Kaname","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13060","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ichinose, Ataru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13061","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Horii, Shigeru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13062","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mukaida, Masashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13063","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"01440320.pdf","filesize":[{"value":"801.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"01440320.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5193/files/01440320.pdf"},"version_id":"54e71827-ddc9-45b0-9167-64e63a623843"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Critical current","subitem_subject_scheme":"Other"},{"subitem_subject":"low temperature growth","subitem_subject_scheme":"Other"},{"subitem_subject":"pinning  center","subitem_subject_scheme":"Other"},{"subitem_subject":"SmBa2Cu3O","subitem_subject_scheme":"Other"},{"subitem_subject":"thin film","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Effect of Sm/Ba substitution on the J/sub c/ in magnetic field of SmBCO thin films by low temperature growth technique","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Effect of Sm/Ba substitution on the J/sub c/ in magnetic field of SmBCO thin films by low temperature growth technique","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-08-01"},"publish_date":"2006-08-01","publish_status":"0","recid":"5193","relation_version_is_last":true,"title":["Effect of Sm/Ba substitution on the J/sub c/ in magnetic field of SmBCO thin films by low temperature growth technique"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:33:20.673895+00:00"}