{"_buckets": {"deposit": "f62cb117-b180-48f8-b72f-20f0797a303d"}, "_deposit": {"id": "5286", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5286"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005286"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1995-06", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "3", "bibliographicPageEnd": "393", "bibliographicPageStart": "385", "bibliographicVolumeNumber": "2", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Dielectrics and Electrical Insulation [see also IEEE Transactions on Electrical Insulation]"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "In order to examine the area and the volume effects on breakdown strength in liquid nitrogen (LN_2), we measured dc and ac breakdown voltages in LN_2 with sphere to plane and coaxial cylindrical electrobe configurations. We also carried out statistical analysis of the experimental results using the Weibull distribution and discussed with the statistical stressed electrode area (SSEA) and / or liquid volume (SSLV). The dc and ac breakdown strength in LN_2 decreased to 1/5 with increasing SSEA and SSLV over the wide range from 10^0 to 10^5 mm^2 and from 10^-1 to 10^5 mm^3, respectively. Weibull shape parameter m for the sphere to plane and the coaxial cylindrical electrodes were estimated to be 6 to 8 and 11 to 13, respectively; the breakdown strength in LN_2 saturated with increasing SSEA and SSLV. From these results, it was verified that the area and the volume effects definitely determined the breakdown strength in LN_2. The results of the Weibull statistics were compared with the conventional concept of the stressed electrode area (SEA) and liquid volume (SLV). Consequently, SSEA or SSLV was found to be nearly equal to 80 to 85% of SEA or SLV.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/6873"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "IEEE"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1109/10.1109/94.395427", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright \u00a9 1995 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University\u2019s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Goshima, H."}], "nameIdentifiers": [{"nameIdentifier": "13386", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hayakawa, N."}], "nameIdentifiers": [{"nameIdentifier": "13387", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hikita, M."}], "nameIdentifiers": [{"nameIdentifier": "13388", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Uchida, K."}], "nameIdentifiers": [{"nameIdentifier": "13389", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "di_el_ins_2_3_385.pdf", "filesize": [{"value": "3.1 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 3100000.0, "url": {"label": "di_el_ins_2_3_385.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/5286/files/di_el_ins_2_3_385.pdf"}, "version_id": "e1250a96-3d6c-44f1-a9bd-9ead3fde8901"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Weibull statistical analysis of area and volume effects on the breakdown strength in liquid nitrogen", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Weibull statistical analysis of area and volume effects on the breakdown strength in liquid nitrogen"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/6873", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2006-08-31"}, "publish_date": "2006-08-31", "publish_status": "0", "recid": "5286", "relation": {}, "relation_version_is_last": true, "title": ["Weibull statistical analysis of area and volume effects on the breakdown strength in liquid nitrogen"], "weko_shared_id": 3}