{"created":"2021-03-01T06:11:50.561515+00:00","id":5287,"links":{},"metadata":{"_buckets":{"deposit":"d2620c10-3704-49d6-9756-083aaf1b9a78"},"_deposit":{"id":"5287","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5287"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005287","sets":["320:321:322"]},"author_link":["13390","13391","13392","13393","13394","13395"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1996-02","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"86","bibliographicPageStart":"80","bibliographicVolumeNumber":"3","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Dielectrics and Electrical Insulation [see also IEEE Transactions on Electrical Insulation]","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We measured dc electric field distribution in transformer oil mixed with different impurities and additives so as to simulate practical degradation conditions of transformer oil. The electric field in the oil doped with asphalt was reduced near the cathode and enhanced near the anode. On the other hand, electric field in oil with copper oleate was enhanced near both electrodes and reduced at the center between the electrodes. The space charge density was estimated from the measured electric field profile using a 1-dimensional form of Gauss law; nagative ions occured more than positive ions by 5 to 40 pC/㎝^3 in the oil with asphalt from 10 to 30 ppm. It was also found that heterocharges with 100 to 300 pC/㎝^3 existed near both electrodes in the oil with copper oleate. Consequently, the electric field and the charge distribution in the oil proved to charge depending on the kind and content of impurities or additives and thus depending on the degradation of the oil.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/6874"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/94.485518","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 1996 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hikita, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13390","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsuoka, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13391","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shimizu, R.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13392","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kato, K.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13393","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayakawa, N.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13394","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13395","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"di_el_ins_3_1_80.pdf","filesize":[{"value":"2.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"di_el_ins_3_1_80.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5287/files/di_el_ins_3_1_80.pdf"},"version_id":"37a0ecd9-2d25-4a3a-98d8-ee04cafc5155"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Kerr electro-optic field mapping and charge dynamics in impurity-doped transformer oil","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Kerr electro-optic field mapping and charge dynamics in impurity-doped transformer oil","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-08-31"},"publish_date":"2006-08-31","publish_status":"0","recid":"5287","relation_version_is_last":true,"title":["Kerr electro-optic field mapping and charge dynamics in impurity-doped transformer oil"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:49:55.478280+00:00"}