{"_buckets": {"deposit": "fcccc8ef-bcb2-4bbb-b8c3-8ac62d8d82ba"}, "_deposit": {"id": "5396", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5396"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005396"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2004-01-12", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicPageEnd": "187", "bibliographicPageStart": "185", "bibliographicVolumeNumber": "84", "bibliographic_titles": [{"bibliographic_title": "Applied Physics Letters"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "Laser-induced fluorescence-dip (LIF-dip) spectroscopy of Ar was used for measuring the distributions of sheath electric fields in low-pressure, inductively-coupled Ar plasmas. A sensitive detection limit of 3 V/cm obtained by LIF-dip allowed the measurement in the presheath region. The distributions of electric fields observed experimentally were compared with those of theoretical calculations based on a simple fluid model. As a result, reasonable agreement between the experiment and the theory was obtained in the electric fields in the sheath region, while the electric fields in the presheath region observed experimentally were higher than the theoretical results.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/7000"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "American Institute of Physics"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1063/1.1639943", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright (2004) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0003-6951", "subitem_source_identifier_type": "ISSN"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Takizawa, K."}], "nameIdentifiers": [{"nameIdentifier": "13784", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, K."}], "nameIdentifiers": [{"nameIdentifier": "13785", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kono, A."}], "nameIdentifiers": [{"nameIdentifier": "13786", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "ApplPhysLett_84_185.pdf", "filesize": [{"value": "164.7 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 164700.0, "url": {"label": "ApplPhysLett_84_185.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/5396/files/ApplPhysLett_84_185.pdf"}, "version_id": "41344833-13c3-40dc-b2ae-c7b39dfadaa1"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Sensitive measurements of electric field distributions in low-pressure Ar plasmas by laser-induced fluorescence-dip spectroscopy", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Sensitive measurements of electric field distributions in low-pressure Ar plasmas by laser-induced fluorescence-dip spectroscopy"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/7000", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2006-10-20"}, "publish_date": "2006-10-20", "publish_status": "0", "recid": "5396", "relation": {}, "relation_version_is_last": true, "title": ["Sensitive measurements of electric field distributions in low-pressure Ar plasmas by laser-induced fluorescence-dip spectroscopy"], "weko_shared_id": 3}