{"_buckets": {"deposit": "f900a954-d2c1-4ef4-a00a-75674f471607"}, "_deposit": {"id": "5420", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5420"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005420", "sets": ["322"]}, "author_link": ["13893", "13894", "13895", "13896", "13897", "13898", "13899"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1997-07-15", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicPageEnd": "638", "bibliographicPageStart": "635", "bibliographicVolumeNumber": "82", "bibliographic_titles": [{"bibliographic_title": "Journal of Applied Physics", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The layer structure and crystal structure of an Er δ-doped layer in InP are analyzed in a one monolayer (ML) level by an x-ray crystal truncation rod (CTR) scattering measurement using synchrotron radiation. The Er δ-doped InP sample is prepared by organometallic vapor phase epitaxy using trimethylindium, tertiarybutylphosphine, and tris(methyl-cyclopentadienyl)erbium as source materials. The analysis is made by comparing the measured CTR spectra and theoretically generated ones assuming four possible crystal structures for the Er δ-doped layers. We reveal that the Er atoms in InP form the rocksalt structure ErP. In the analysis of the crystal structure the x-ray interference plays a vital role. Er distribution in the δ-doped layer is clearly resolved in 1 ML level. It is shown that the Er atoms are well confined in 5 ML(15 Å) thickness. The total amount of Er atoms is 0.171 ML, which is quite close to 0.2 ML obtained by Rutherford backscattering measurement on the same sample.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/7024"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "American Institute of Physics", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1063/1.365591", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright (1997) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0021-8979", "subitem_source_identifier_type": "PISSN"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Takeda, Yoshikazu", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13893", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fujita, Keiji", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13894", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Matsubara, Naoteru", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13895", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamada, Naoki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13896", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ichiki, Satofumi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13897", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tabuchi, Masao", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13898", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fujiwara, Yasufumi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13899", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "JApplPhys_82_635.pdf", "filesize": [{"value": "235.7 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 235700.0, "url": {"label": "JApplPhys_82_635.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/5420/files/JApplPhys_82_635.pdf"}, "version_id": "0916870c-502b-4cdc-898f-40a2cb54042d"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/7024", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2006-10-23"}, "publish_date": "2006-10-23", "publish_status": "0", "recid": "5420", "relation": {}, "relation_version_is_last": true, "title": ["Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering"], "weko_shared_id": -1}