{"created":"2021-03-01T06:11:58.845848+00:00","id":5420,"links":{},"metadata":{"_buckets":{"deposit":"f900a954-d2c1-4ef4-a00a-75674f471607"},"_deposit":{"id":"5420","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5420"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005420","sets":["320:321:322"]},"author_link":["13893","13894","13895","13896","13897","13898","13899"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1997-07-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"638","bibliographicPageStart":"635","bibliographicVolumeNumber":"82","bibliographic_titles":[{"bibliographic_title":"Journal of Applied Physics","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The layer structure and crystal structure of an Er δ-doped layer in InP are analyzed in a one monolayer (ML) level by an x-ray crystal truncation rod (CTR) scattering measurement using synchrotron radiation. The Er δ-doped InP sample is prepared by organometallic vapor phase epitaxy using trimethylindium, tertiarybutylphosphine, and tris(methyl-cyclopentadienyl)erbium as source materials. The analysis is made by comparing the measured CTR spectra and theoretically generated ones assuming four possible crystal structures for the Er δ-doped layers. We reveal that the Er atoms in InP form the rocksalt structure ErP. In the analysis of the crystal structure the x-ray interference plays a vital role. Er distribution in the δ-doped layer is clearly resolved in 1 ML level. It is shown that the Er atoms are well confined in 5 ML(15 Å) thickness. The total amount of Er atoms is 0.171 ML, which is quite close to 0.2 ML obtained by Rutherford backscattering measurement on the same sample.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/7024"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.365591","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (1997) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0021-8979","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takeda, Yoshikazu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13893","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujita, Keiji","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13894","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsubara, Naoteru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13895","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamada, Naoki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13896","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ichiki, Satofumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13897","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tabuchi, Masao","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13898","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujiwara, Yasufumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13899","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"JApplPhys_82_635.pdf","filesize":[{"value":"235.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"JApplPhys_82_635.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5420/files/JApplPhys_82_635.pdf"},"version_id":"0916870c-502b-4cdc-898f-40a2cb54042d"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-10-23"},"publish_date":"2006-10-23","publish_status":"0","recid":"5420","relation_version_is_last":true,"title":["Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:49:55.765002+00:00"}