{"created":"2021-03-01T06:12:00.249878+00:00","id":5442,"links":{},"metadata":{"_buckets":{"deposit":"979815c2-6726-49f7-889f-72e9cb5f38e0"},"_deposit":{"id":"5442","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5442"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005442","sets":["336:695:696"]},"author_link":["13985","13986","13987","13988","13989"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-03","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"033905","bibliographicPageStart":"033905","bibliographicVolumeNumber":"77","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We report an instrument with the combination of solution jet beam deposition method and ultraviolet photoelectron spectroscopy (UPS). The solution jet beam method is a novel technique to fabricate organic thin films in vacuum, where solution of the organic material is sprayed in vacuum. This method can be applied to organic materials which cannot be vacuum evaporated due to thermal decomposition, e.g., ionic organic solids such as cyanine dyes. The present instrument combines this method with UPS, which is a powerful method for investigating the electronic structure of solids. Using this instrument, the UPS spectra of cyanine dye films deposited by the solution jet beam method were measured without exposure to air. The observed spectra were clearer than those of spin-coated films exposed to air.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"5pages","subitem_description_language":"en","subitem_description_type":"Other"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/7048"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.2185132","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (2006) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0034-6748","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Okabayashi, Y.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13985","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"kanai, K.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13986","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ouchi, Y.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13987","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Seki, K","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"13988","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"関, 一彦","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"13989","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"RevSciInstrum_77_033905.pdf","filesize":[{"value":"283.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"RevSciInstrum_77_033905.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5442/files/RevSciInstrum_77_033905.pdf"},"version_id":"9ec7469a-e819-4a60-b029-5726b48f8ce4"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Apparatus for solution jet beam deposition of organic thin films and in situ ultraviolet photoelectron spectroscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Apparatus for solution jet beam deposition of organic thin films and in situ ultraviolet photoelectron spectroscopy","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["696"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2006-10-24"},"publish_date":"2006-10-24","publish_status":"0","recid":"5442","relation_version_is_last":true,"title":["Apparatus for solution jet beam deposition of organic thin films and in situ ultraviolet photoelectron spectroscopy"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T04:19:58.479202+00:00"}