@article{oai:nagoya.repo.nii.ac.jp:00005568,
 author = {Calixte, Evenson and Yokomizu, Yasunobu and Shimizu, Hirotaka and Matsumura, Toshiro and Fujita, Hideki},
 journal = {Proceedings of the Power Conversion Conference (PCC Osaka 2002)},
 month = {Apr},
 note = {Calculations were carried out to study the effect of a semiconductor type of fault current limiter (FCL) upon the interrupting duty imposed on a circuit breaker when a fault occurs at a distance of 1 to 8 km downstream from the load side terminals of the FCL. For comparison purpose, we also look at the interrupting condition when the fault happens very close to the terminals of the circuit breaker The semiconductor type of FCL in current-limiting operation was assumed to have a limiting element composed of either an inductance or a resistance. For all fault locations, the insertion of the resistive FCL proved to decrease not only the fault current, but also the rate of rise of the recovery voltage (rrrv). For the inductive FCL, the rrrv depends mainly upon the stray capacitance Cp of the limiting coil. Under short-line fault (SLF) condition, the introduction of the inductive FCL with Cp=100 nF is shown to reduce the severity of the SLF transient by reducing the fault current and the rrrv. However for all fault locations, the insertion of the inductive FCL with Cp =10 nF was found to decrease the fault current, while increasing the rrrv.},
 pages = {1423--1428},
 title = {Reduction Effect of Semiconductor Type Fault Current Limiter on Interrupting Duty of a Circuit Breaker},
 year = {2002}
}