{"created":"2021-03-01T06:12:14.564875+00:00","id":5670,"links":{},"metadata":{"_buckets":{"deposit":"ed55c3dd-31b2-49a3-85ec-5eed8bde2f43"},"_deposit":{"id":"5670","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5670"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005670","sets":["320:321:322"]},"author_link":["15041","15042","15043","15044"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"445","bibliographicPageStart":"440","bibliographicVolumeNumber":"13","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Power Delivery","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We measured the temporal change of partial discharge (PD) characteristics leading to breakdown in SF_6, gas for ac voltage application. At the final stage close to the breakdown, positive PD pulses with relatively high magnitude began to take place in the phase region near the applied voltage peak. This event was interpreted in terms of the change of PD type in SF_6 gas from streamer to leader. Optical observation also revealed that PD type transition occurred. With the results considered, the mechanisms of PD were discussed. Moreover, we discussed the possibility of breakdown prediction in GIs. An attempt was made to find a breakdown prediction parameter which characterized the change of PD type: the ratio R_L of maximum charge to the average charge of PD pulses appearing in the phase region near the peak in positive half cycle. It was found that R_L, allowed to predict the time to breakdown successfully within the error of 4～20 %.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/7276"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/61.660912","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 1998 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0885-8977","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Okubo, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15041","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kato, T.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15042","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayakawa, N.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15043","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hikita, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15044","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"00660912.pdf","filesize":[{"value":"783.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"00660912.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5670/files/00660912.pdf"},"version_id":"e70d38b3-a3b4-4320-a48a-f2b48ced888c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Temporal Development of Partial Discharge and Its Application to Breakdown Prediction in SF_6 Gas","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Temporal Development of Partial Discharge and Its Application to Breakdown Prediction in SF_6 Gas","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-01-25"},"publish_date":"2007-01-25","publish_status":"0","recid":"5670","relation_version_is_last":true,"title":["Temporal Development of Partial Discharge and Its Application to Breakdown Prediction in SF_6 Gas"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:50:22.372860+00:00"}