@article{oai:nagoya.repo.nii.ac.jp:00005935,
 author = {中崎, 峰子 and 壷井, 基裕 and 金川, 和世 and 加藤, 丈典 and 鈴木, 和博 and Nakazaki, Mineko and Tsuboi, Motohiro and Kanagawa, Kazuyo and Katou, Takenori and Suzuki, Kazuhiro},
 journal = {名古屋大学博物館報告},
 month = {Dec},
 note = {This paper describes analytical procedures to determine 10 major and 15 trace elements in silicate rocks, using an X-ray fluorescence analyzer (Shimadzu SFX 1800) with a Rh target at the Center for Chronological Research, Nagoya University. Analyses are carried out on glass bead prepared through fusion of sample and flux (Li2B4O7) mixture in the proportion of 0.7g : 6.0g for major elements (Si, Ti, Al, Fe, Mn, Mg, Ca, Na, K, P) and 2g : 3g for trace elements (V, Cr, Co, Ni, Cu, Zn, As, Rb, Sr, Y, Zr, Nb, Ba, Pb,Th). Calibration curves for the major elements cover a wide compositional range of igneous, metamorphic and sedimentary silicate rocks. Calibration curves for the trace elements are corrected for spectral line-overlap and matrix effect, and carry out reliable analyses at concentration above 2-10ppm., 国立情報学研究所で電子化したコンテンツを使用している。},
 pages = {79--91},
 title = {X線分析装置XRF-1800による岩石の定量化学分析},
 volume = {20},
 year = {2004}
}